onTAP JTAG Blog

Whose Problem Is This?

May 6, 2015

Who cares. The owner of the problem is not necessarily always the issue. Blame most often gets thrown around the work place when things don’t work, and a resolution is needed. From time to time, we encounter situations where a field applications specialist is on-site with a customer, working through a support issue because their company’s device just “stopped working.” Well, the most important thing in that moment is not to go into damage control mode. But rather, accept and identify the problem, then develop a solution. Sounds simple, and it can be by utilizing JTAG boundary scan.

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How much money is sitting in the bone pile?

April 29, 2015

One of the most common comments we hear from our customers and business partners sounds something like this: “Well, I’ve heard about boundary scan testing, and have actually used it a bit before. Moving forward, we have a new project we need to use it on, and we have a bone pile I might get to.”

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Manufacturing: Save Yourself, & The Project, Lots Of Money!

April 22, 2015

Now that your board has moved from prototyping to manufacturing, things are humming along until…there is a snag in manufacturing. Suddenly an entire run of boards is failing for unknown reasons, and you’re already dangerously close to being behind schedule.

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Reducing Costs During Prototyping

April 15, 2015

In our last discussion, we talked about DFT, which plays a significant role in reducing costs in prototyping. There are a wide variety of reasons that prototyping is a significant expense in the development and production processes. A large part of the cost is the increasing complexity of designs, inclusion of more processors and FPGA’s, greatly reduced board real estate, and diminishing test access. With the cost of FPGA’s and processors rising as they too become more powerful, getting small batches of devices is expensive. If one of those devices is fried during prototype testing, the cost to prototype a new design escalates rapidly, especially if the cause of the failure isn’t quickly determined.

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Design For Testability?

April 8, 2015

Design for Testability, often referred to as DFT, is a critical part of developing a new board. Here’s a link to a terrific class lecture from University of Maryland if you’re interested in seeing a well represented academic presentation of such an important topic.

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