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Welcome to the onTAP JTAG Blog
Groundhog Day Sale February 2, 2010When you purchase any onTAP Boundary Scan Software license, we are giving you the option to add another license to your package for FREE*. That’s right, FREE. Buy a development seat for the lab, or an MTO for manufacturing, and get another one for a co-worker. You have your choice of an MTO or DLL.
Happy New Year – Welcome 2010 January 18, 2010We hope everyone is off to a strong and promising 2010. By all signs, it appears that this year will deliver new innovations and products to the electronics market. We certainly are excited to hear about our customers new projects and are looking forward to sharing our new developments with you through out the course [...]
Properly Managing Common Tri-State Control Cells Boosts Fault Coverage December 16, 2009We are constantly exposed to new situations in boundary scan test and new approaches to using boundary scan to achieve better test fault coverage. One item standing in the way of higher, more accurate fault coverage is common tri-state control cells.
Accepting New Turnkey JTAG Projects November 17, 2009We insure that your boundary scan tests are maximized for the highest possible fault coverage, are completely debugged, and are ready to put in the hands of test engineers on the manufacturing floor, so all they have to do is “press a button.”
We support our tests and we will support your manufacturer by answering questions and bringing them up-to-speed with boundary scan test and onTAP.
Current and potential customers of onTAP Boundary Scan Solutions, and onTAP Series 4000 are able to use some of StarTest’s hardware and software solutions (DIMM/SODIMM External Modules, TAP Distributor and Bridge-For-Testability hardware tools, Operator Fault Spotlight software tool), as built-in features of the onTAP Boundary Scan Solution, usable throughout the users’ product lifecycle, including volume manufacturing and in-the-field troubleshooting and repair.
onTAP BIST (Built In Self Test) November 4, 2009Tests may be defined in script files which may then be translated into executable Serial Vector Format (SVF) files. The general approach is to place all of the required BSDL files into a folder and then to relate the BSDL files to circuit locations in declarations at the beginning of the script file. Once BIT_STRINGS are [...]
The Importance of Testing for Mid-State/Resistive Shorts November 2, 2009Mid-state shorts are a major problem that often goes undetected by typical boundary scan connectivity tests is mid-state/resitive shorts. Flynn Systems recognized this “hole” in boundary scan testing and was the first boundary scan test company to test for mid-state shorts, improving test fault coverage.
PC Based Parallel Test October 30, 2009Ontap_parallel.exe can be used to simultaneously run test suites on multiple PC boards using the onTAP DLL. Parallel board testing must be enabled for the DLL license. Testing is fastest on a multiple processor PC , particularly where one core processor is available for each board. For example if four PC boards are being tested in parallel, then a quad core processor is recommended so that the time to test four boards is about the same as that required to test one board.
JTAG.TECT Reviews onTAP JTAG System October 29, 2009
Written by: Dr. Ami Gorodetsky of JTAG.TECT
Please follow this link for the original Russian:
http://www.jtag-test.ru/JTAGUniversity/articles/12-PE_6_2009.php
View Dr. Ami Gorodetsky’s blog:
http://moodle.cs.huji.ac.il/cs08/course/view.php?id=67703
In the 7th paper of our “JTAG and DFT Basics Tutorial” series we had briefly examined the software basics of US based Flynn Systems’ (www.flynn.com ) onTAP Boundary Scan system that is intended for [...]