Updates
Thank you for your continued interest in onTAP Series 4000 with support for
IEEE 1149.1 and 1149.6.
- All onTAP users with active software maintenance and 30-day evaluation licenses may download updates.
- If your support contract is expired, please do not download the latest version of onTAP.
- Updates are cumulative – we strongly advise keeping up with the latest builds.
- For a complete listing of all software changes look in the onTAP online HELP section, "onTAP Change History."
- Please fill in the required information below to receive your updated version of onTAP.
IMPORTANT NOTE:
Currently we are developing support for industry standard USB JTAG cables such as the XILINX Platform USB and Altera USB Blaster. In doing so, some routines within onTAP have been altered. For the moment, some users may find that onTAP will not load because the Windows environment does not have the necessary settings to enable onTAP to properly function. Please download this Microsoft® file – http://www.microsoft.com/downloads/details.aspx?familyid=9b2da534-3e03-4391-8a4d-074b9f2bc1bf&displaylang=en (if this link does not work, please copy and paste it into your browser).
Current build 4194. Updated July 23, 2010
| onTAP Build Change Log | |
| Build 4194 | Upgrades code related to serial flash programming models |
| Build 4193 | Corrects problem in DTS models when passing in values to subroutines and calling subroutines from subroutines |
| Build 4192 | Usability enhancements |
| Build 4191 |
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| Build 4190 | Corrects problem updating pin register values in DTS models when running cluster tests in multi-chain applications |
| Build 4189 |
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| Build 4187 | Upgrades User Defined script capabilities |
| Build 4186 | Adds capability to run Play/Record binary files in buffered mode, reducing run time and eliminating program latency while in the Run-Test/Idle state |
| Build 4184 |
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| Build 4183 |
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| Build 4181 | Updates User Defined code. |
| Build 4179 | Ensures that pins are alternately selected to drive a net when the pins are joined by low-ohm resistors, providing each pin a chance to drive high and low multiple times. |
| Build 4178 | Allows for use of for-loops in User Defined tests. |
| Build 4177 | Updates Protel netlist translator |
| Build 4174 | Sets preload capture values for to opposite value of expected capture values. |
| Build 4173 | Updates 1149.6 related settings. |
| Build 4172 | Add preload provisions for 1149.6 sample instruction. |
| Build 4171 | Corrects problem related to incorrect test values in multi-chain applications for the vectors following the SAMPLE instruction for some configurations. |
| Build 4170 | Improves usability of ProScan graphical debug environment by adding advanced controls for search, pin level diagnostics, and ease of switching between and running tests. |
| Build 4166 |
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| Build 4165 |
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| Build 4164 | Corrects DTS test generation where EXTERNAL pin declarations are used when large numbers of cells with common control cells are present. |
| Build 4163 | Adds screen to view onTAP Network License Manager’s server screen. |
| Build 4162 |
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| Build 4161 | Corrects problem with IDCODE tests resulting from millisecond delay settings in multi-chain tests or when specified on the Settings page. |
| Build 4160 |
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| Build 4158 |
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| Build 4157 | Improves stability in ProScan debugging environment |
| Build 4156 | Enables manual input of text in the License Request Folder Edit box on the Help About page. |
| Build 4155 | Statically links Windows DLLs to enable that user’s have the correct DLLs |
| Build 4153 |
Corrects potential false failures in multi-chain applications |
| Build 4152 | Ads stability when generating tests for some multi-JTAG chain applications |
| Build 4151 |
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| Build 4150 | Adds support for Xilinx USB Platfrom Cable (Beta). |
| Build 4149 | Adds SAMPLE/PRELOAD instruction as a default in first cluster test scan prior to EXTEST instruction. |
| Build 4148 |
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| Build 4146 | Improves coverage for handling guards when current limiting is enabled |
| Build 4145 |
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| Build 4143 |
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| Build 4142 | Changes the Scan switch factor on the Settings page to a current limiting switch factor (CLSF). Values greater than one limit the total number of pins that can be active at one time during the opens, stuck-at, and pull resistor tests. |
| Build 4141 | Improves handling of edits to attributes and pin-map model assignments on the non-Scan page. |
| Build 4140 |
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