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Updates

Thank you for your continued interest in onTAP Series 4000 with support for
IEEE 1149.1 and 1149.6.

  • All onTAP users with active software maintenance and 30-day evaluation licenses may download updates. 
  • If your support contract is expired, please do not download the latest version of onTAP.
  • Updates are cumulative – we strongly advise keeping up with the latest builds.
  • For a complete listing of all software changes look in the onTAP online HELP section, "onTAP Change History."
  • Please fill in the required information below to receive your updated version of onTAP.

IMPORTANT NOTE:
Currently we are developing support for industry standard USB JTAG cables such as the XILINX Platform USB and Altera USB Blaster.  In doing so, some routines within onTAP have been altered.  For the moment, some users may find that onTAP will not load because the Windows environment does not have the necessary settings to enable onTAP to properly function.  Please download this Microsoft® file – http://www.microsoft.com/downloads/details.aspx?familyid=9b2da534-3e03-4391-8a4d-074b9f2bc1bf&displaylang=en (if this link does not work, please copy and paste it into your browser).

Current build 4194. Updated July 23, 2010

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onTAP Build Change Log
Build 4194 Upgrades code related to serial flash programming models
Build 4193 Corrects problem in DTS models when passing in values to subroutines and calling subroutines from subroutines
Build 4192 Usability enhancements
Build 4191
  • Adds capability to write message strings with variables from within the ShowFail(message) instruction
  • Adds capability to run script-generated SVF files with updated scans based on varying bit string values
Build 4190 Corrects problem updating pin register values in DTS models when running cluster tests in multi-chain applications
Build 4189
  • Corrects problem setting preload values for 1149.6 AC differential receivers when the pin type is bidirectional
  • Corrects problem setting guards from ProScan on bidirectional differential receiver pins.
  • Corrects problem related to option on Jumpers page to automatically add jumpers for IEEE 1149.6 testing of capacitively coupled devices.
  • Extends capability so that in-line resistors are accounted for
Build 4187 Upgrades User Defined script capabilities
Build 4186 Adds capability to run Play/Record binary files in buffered mode, reducing run time and eliminating program latency while in the Run-Test/Idle state
Build 4184
  • Updates support for onTAP GPIO Serializer
  • Corrects test generation problem when pins from devices in multiple JTAG chains are used in cluster tests
  • Upgrades handling of unplug-plug events for onTAP USB cables
Build 4183
  • Adds support for AUG netlist format.
  • Corrects problem showing bit-string message values in user-defined scripts.
Build 4181 Updates User Defined code.
Build 4179 Ensures that pins are alternately selected to drive a net when the pins are joined by low-ohm resistors, providing each pin a chance to drive high and low multiple times.
Build 4178 Allows for use of for-loops in User Defined tests.
Build 4177 Updates Protel netlist translator
Build 4174 Sets preload capture values for to opposite value of expected capture values.
Build 4173 Updates 1149.6 related settings.
Build 4172 Add preload provisions for 1149.6 sample instruction.
Build 4171 Corrects problem related to incorrect test values in multi-chain applications for the vectors following the SAMPLE instruction for some configurations.
Build 4170 Improves usability of ProScan graphical debug environment by adding advanced controls for search, pin level diagnostics, and ease of switching between and running tests.
Build 4166
  • Improves Reset operation of USB cable when Reset buttons are clicked and when calling Reset from the onTAP DLLs.
  • Adjusts diagnostic message for no-connect pins in the event of stuck-at faults.
  • Upgrades use of  EXTEST_TRAIN instruction for 1149.6 AC testing.
Build 4165
  • Adds pin-wiggle capability in ProScan for 1149.6 AC coupled pins.
  • Upgrades Guards+Attributes tab in ProScan to facilitate setting guards, attributes, recompiling, and rerunning tests from within ProScan.
  • Corrects problem showing test messages for multi-chain applications.
  • Adjusts FabMaster netlist translator code.
Build 4164 Corrects DTS test generation where EXTERNAL pin declarations are used when large numbers of cells with common control cells are present.
Build 4163 Adds screen to view onTAP Network License Manager’s server screen.
Build 4162
  • Updates for Play/Record feature used when loading configuration files.
  • Updates for licensing and onTAP Network License Manager.
Build 4161 Corrects problem with IDCODE tests resulting from millisecond delay settings in multi-chain tests or when specified on the Settings page.
Build 4160
  • Includes updates for programming Lattice FPGAs.
  • Upgrades differential pair testing. Reads port groupings of differential pair pins in BSDL files and accounts for all positive and negative side pins using BSDL files and netlist.
Build 4158
  • Adds Play/Record feature for SVF program configuration files. Play/Record converts SVF files to binary, allowing faster programming. Play / Record can be enabled from the Cables menu for specific SVF files.
  • Ensures that guard constraints in the Browse Circuit view are updated when a guard condition is changed the Vector view
Build 4157 Improves stability in ProScan debugging environment
Build 4156 Enables manual input of text in the License Request Folder Edit box  on the Help About page.
Build 4155 Statically links Windows DLLs to enable that user’s have the correct DLLs
Build 4153


Corrects potential false failures in multi-chain applications


Build 4152 Ads stability when generating tests for some multi-JTAG chain applications
Build 4151
  • Corrects problem writing failure reports from Mfg test screen when Operator, Serial Number, and Unit Type text strings are entered.
  • Adds pin-wiggling capability on Nets screen and ProScan for the Xilinx USB cable
Build 4150 Adds support for Xilinx USB Platfrom Cable (Beta).
Build 4149 Adds SAMPLE/PRELOAD instruction as a default in first cluster test scan prior to EXTEST instruction.
Build 4148
  • Corrects test generation for circuits with shared control cells to ensure that only one driver on a net is active at one time.
  • Moves license file, LogicPinMaps and other files within the onTAP folder to the c:\Flynn Systems Corp\onTAP folder, in order to avoid write protected folders within the c:\Program Files folder. The default installation folder is still c:\Program Files\onTAP.
  • Adds code in preparation of support for the Xilinx USB Cable II.
Build 4146 Improves coverage for handling guards when current limiting is enabled
Build 4145
  • Corrects problem with current-limiting option.
  • Corrects problem writing serial-number-specific files when testing from the Manufacturing Test screen.
Build 4143
  • Adds netlist translator support for IPL Wirelist netlists
  • Includes adjustment for the current limiting option
Build 4142 Changes the Scan switch factor on the Settings page to a current limiting switch factor (CLSF). Values greater than one limit the total number of pins that can be active at one time during the opens, stuck-at, and pull resistor tests.
Build 4141 Improves handling of edits to attributes and pin-map model assignments on the non-Scan page.
Build 4140
  • Adjusts ground bounce switch factor operation for pull-up/down tests.
  • Introduces option to add vectors and extend fault coverage in applications where pins share common tri-state control cells. The option is controlled by the “Alternate drive on pins having common control cells” check box on the settings page and the default setting is enabled.
  • Ensures that all eligible pins alternate drive on nets having multiple scan pins.
  • Corrects problem showing all LogicPinMap models on the non-Scan page.

 

 



Flynn Systems Corporation, 74 Northeastern Blvd., Nashua, NH 03062
Ph: (603) 598-4444 Fax: (603) 598-4111 sales@flynn.com All rights reserved.