Boundary Scan Products & Services

Develop, Debug, and Run Boundary Scan/JTAG Interconnect, Cluster Test, and Program FLASH

Features automated, netlist based test development (includes a built-in netlist merge), with minimal user intervention. Quickly and easily develop interconnect tests, memory cluster tests, configure scan devices (CPLDs, FPGAs), and program FLASH. Enables easy incorporation of multiple chains, multi-die modules, merged sub-assemblies, multi-drop configurations.

* Includes all software needed to develop and run tests.

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Run Boundary Scan/JTAG Tests, Program FLASH, and FPGAs

Designed specifically for manufacturing test environments, onTAP enables users to run any onTAP tests, including memory cluster tests and Flash programming. The MTO restricts access to test development screens and files. ProScan provides accurate pin-level diagnostics and simple debug features such as toggling pins.

Speed up your manufacturing process while ensuring accuracy.

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ProScan – Proprietary Graphical Test Development and Debug Environment for onTAP

ProScan provides direct access to development tools and settings in a test environment, facilitating debug for your boundary scan test(s). Power packed with built-in pin-level diagnostics, a netlist browser, pin toggler, and comprehensive test reports, this tool allows you to manage all your boundary scan debug needs from one screen.

Learn more about how ProScan will make your boundary scan project easier and more effective!

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Enables onTAP w/ LabVIEW™ & other Third Party Test Executives

Run all of your onTAP boundary scan tests from any third party test executive, including National Instruments’ LabVIEW™ and Teradyne ATE In-Circuit Test Equipment.

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onTAP USB High Speed JTAG Test and Programming Cable – Plug and Play

The TAP CONNECT is the High Speed USB JTAG Test and Programming cable boundary scan test hardware from Flynn Systems. It provides a dual channel, 28.8 MHz link between onTAP and your application(s), using flying leads, Xilinx type header, or Altera type header.

• Adjustable TCK Clock 280KHz – 15MHz + 28.8MHz
• Dual channel – run two chains from one cable
• Adjustable internal voltage 1.8V – 4.5V
• Auto sensing voltage through VREF for devices operating from 1.8V to 5V
• External VREF 1.8V – 4.5V
• Connect to popular Xilinx and Altera style headers, or use flying leads
• Program Flash in less time than standard cables
• Test and program multiple chains at high speeds
• Cut test and programming times by at least 30%
• Hot plug and play

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The onTAP Serializer and GPIO board offers two functions on one board. First multiple JTAG chains can be configured into one JTAG chain and secondly 196 general purpose I/O points are available to include in a user’s JTAG chain.

• TAP I/O voltages from 1.8V to 4.5V at each JTAG port
• JTAG Tap Serializer for 1-4 JTAG Taps
• VREF Voltage Sources from 1.8 – 4.5V
• Independent 196 GPIO Drive and Capture Test Points

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• Performs both interconnect and cluster tests on DIMM/SODIMM memory sockets using onTAP Boundary Scan Tests
• Tests for opens on PWR and GND pins of the DIMM/SODIMM sockets
• Each I/O pin is independently controlled
• Keyed flat connector compatibility
• Hot Swap
• Equipped with a JTAG/IEEE 1149.1 Test Access Port (TAP)
• Full software support both for use and self-test
• Full compatibility with Flynn Systems’ onTAP Series 4000
• Supports a wide range of DIMM, microDIMM, SODIMM, SOCDIMM, and SORDIMM socket formats

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