Flynn Systems maintains its focus on developing and providing a comprehensive and reliable boundary scan / JTAG tool set that delivers robust boundary scan solutions. This, coupled with the highest possible test fault coverage, creates the best value for the customer. Built on 10 years of boundary scan experience and expertise, continuous product developments, and customer input, Flynn Systems introduces the IEEE 1149 compliant onTAP Series 4000 Boundary Scan Software and Hardware package featuring ProScan, our new graphical JTAG test debug environment. A 2009 Best in Test Finalist!

Experience the features and robust solutions that make onTAP Series 4000 so valuable.

Runs on Windows 2000 – Windows 7

Click here to learn more about our boundary scan test development services.

onTAP Development – Develop, Debug, and Run Boundary Scan/JTAG Interconnect, Cluster Test, and Program FLASH

Features automated, netlist based test development (includes a built-in netlist merge), with minimal user intervention.  Quickly and easily develop interconnect tests, memory cluster tests, configure scan devices (CPLDs, FPGAs), and program FLASH. Enables easy incorporation of multiple chains, multi-die modules, merged sub-assemblies, multi-drop configurations.

* Includes all software needed to develop and run tests.

onTAP Manufacturing (MTO) – Run Boundary Scan/JTAG Tests, Program FLASH, and FPGAs

Designed specifically for manufacturing test environments, onTAP enables users to run any  onTAP tests, including memory cluster tests and Flash programming.  The MTO restricts access to  test development screens and files. ProScan provides accurate pin-level diagnostics and simple   debug features such as toggling pins.

Speed up your manufacturing process while ensuring accuracy.

ProScan – Proprietary Graphical Test Development and Debug Environment for onTAP

ProScan provides direct access to development tools and settings in a test environment, facilitating debug for your boundary scan test(s). Power packed with built-in pin-level diagnostics, a netlist browser, pin toggler, and comprehensive test reports, this tool allows you to manage all your boundary scan debug needs from one screen.

Learn more about how ProScan will make your boundary scan project easier and more effective!

onTAP DLL – Enables onTAP w/ LabVIEW™ & other Third Party Test Executives

Run all of your onTAP boundary scan tests from any third party test executive, including National Instruments’ LabVIEW™ and Teradyne ATE   In-Circuit Test Equipment. 

onTAP USB High Speed JTAG Test and Programming Cable – Plug and Play

The onTAP High Speed USB JTAG Test and Programming cable is the newest piece of boundary scan test hardware from Flynn Systems, providing a dual channel, 28.8 MHz link between onTAP and your application(s), using flying leads, Xilinx type header, or Altera type header.

• Adjustable TCK Clock 280KHz – 15MHz + 28.8MHz
• Dual channel – run two chains from one cable
• Adjustable internal voltage 1.8V – 4.5V
• Auto sensing voltage through VREF for devices operating from 1.8V to 5V
• External VREF 1.8V – 4.5V
• Connect to popular Xilinx and Altera style headers, or use flying leads
• Program Flash in less time than standard cables
• Test and program multiple chains at high speeds
• Cut test and programming times by at least 30%
• Hot plug and play

onTAP USB Test and Programming Cable – Plug and Play

The onTAP USB Test and progamming cable is your link between onTAP and your boundary scan/JTAG application with Xilinx-style flying leads or ribbon cable, Altera-style adapter cable, or custom header adapters.

• Adjustable TCK Clock
• Automatically senses and adjusts to target I/O voltages
• Interfaces to devices operating at 1.5 to 5.0 VDC
• Self-adjusts to the target chain using the Verify VRef voltage
• Configure to many different JTAG ports
• Easily handle multiple chains.

onTAP Serializer and GPIO Board

The onTAP Serializer and GPIO board offers two functions on one board. First multiple JTAG chains can be configured into one JTAG chain and secondly 196 general purpose I/O points are available to include in a user’s JTAG chain.

• TAP I/O voltages from 1.8V to 4.5V at each JTAG port
  
• JTAG Tap Serializer for 1-4 JTAG Taps
• VREF Voltage Sources from 1.8 – 4.5V
• Independent 196 GPIO Drive and Capture Test Points

• Performs both interconnect and cluster tests on DIMM/SODIMM memory sockets using onTAP Boundary Scan Tests
• Tests for opens on PWR and GND pins of the DIMM/SODIMM sockets
• Each I/O pin is independently controlled
• Keyed flat connector compatibility
• Hot Swap
• Equipped with a JTAG/IEEE 1149.1 Test Access Port (TAP)
• Full software support both for use and self-test
• Full compatibility with Flynn Systems’ onTAP Series 4000
• Supports a wide range of DIMM, microDIMM, SODIMM, SOCDIMM, and SORDIMM socket formats

Click here for more details

onTAP Expert Boundary Scan Test Development Services

Developing boundary scan/JTAG tests and debugging can be a time consuming proposition.  That is why Flynn Systems offers a turnkey JTAG solution.  We have developed tests for many of our customers with great results.  Our turnkey solution saves time and resources in boundary scan test development by allowing you to go straight to the manufacturing floor with proven boundary scan tests.

onTAP Technical Support 

Learn more about the benefits of maintaining a current technical support agreement.  Get access to technical support via phone and e-mail, the most current onTAP updates, periodic e-mails alerting you to new improvements, major upgrades, and special pricing.

Technical Support PDF
 

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