JEM_DIMM/SODIMM Module

 JEM_DIMM/SODIMM Socket Test Modules for JTAG Test using onTAP Series 4000

StarTest (JTAG.TECT), our distributor for Russia and former USSR, developed a wide array of memory modules for use in JTAG test. If you have any questions about a memory module, please contact sales@flynn.com.

The StarTest JEM_DIMM/SODIMM modules main features are: Performs both interconnect and cluster tests on DIMM/SODIMM memory sockets Tests for opens on PWR and GND pins of the DIMM/SODIMM sockets Each I/O pin is independently controlled for sense, drive, bi-directional, and tri-state function Keyed flat connector compatibility Hot Swap: each module may be connected/disconnected between tests without switching power off Equipped with a JTAG/IEEE 1149.1 Test Access Port (TAP) externally (via cable) or internally (via socket) accessible Full software support both for usage and the self-test

The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system, and to strengthen the memory-independent JTAG testing for the assembly correctness of the following socket types:

• DIMM (Dual In-line Memory Module), miniDIMM, microDIMM, VLP DIMM sockets
• SODIMM (Small Outline Dual In-line Memory Module) sockets
• SORDIMM (Small Outline Registered Dual In-line Memory Module) sockets
• SOCDIMM (Small Outline Clocked Dual In-line Memory Module) sockets
• VLP SORDIMM (Very Low Profile Small Outline Registered Dual In-line Memory Module) sockets
• FBDIMM (Fully Buffered Dual In-line Memory Module) sockets

For many designs, JTAG test has adequate access to on-board signals, but signals that go off the board often can not be tested. By adding JTAG access to memory socket off-board signals, a JEM_DIMM/SODIMM module can increase the board’s fault coverage, possibly reducing the need for developing alternative tests to reach the required test coverage level. The JEM_DIMM/SODIMM module provides a number of JTAG accessible individually controlled test channels that can be used to control and observe signals that go off the board.

It is possible to test the DIMM/SODIMM socket assembly correctness by inserting a DIMM/SODIMM memory module into the corresponding socket and executing a JTAG memory-pattern test. For the usage of this technique the specific memory JTAG test module have to be utilized for write/read memory operations and test results diagnostics.

Click here to download the JEM_DIMM/SODIMM product brief PDF

• onTAP Development
• onTAP Manufacturing (MTO)
• onTAP ProScan – feature
• onTAP DLL
• onTAP License Types
• onTAP HighSpeed Cable
• onTAP USB JTAG Cable
• onTAP Serializer and GPIO
• onTAP Turnkey Service
• *Product Documentation*
• JEM_DIMM/SODIMM Module
• onTAP Series 4000 Overview
• Price List Chart
• FS-ATG