How to purchase onTAP:

Please note that when purchasing multiple licenses, each license must have the same options enabled in order for you to properly run your tests. For example, if you purchase the onTAP Development with Memory Cluster Testing & Flash Programming, the onTAP MTO or DLL, you will require the Cluster Testing & Flash Programming option in order to run any cluster tests. 

Options & Flex Licensing          Hardware

CAD netlist based with over 2 dozen readers and includes:

• Development tools for JTAG Test development:
  onTAP is IEEE 1149.1 and
  IEEE 1149.6 compliant
  
  • Notebook page development organizer
  • Netlist browser
  • Run-time test screen
  • ProScan
• ProScan debug environment 
  • Netlist overlaid on graphical debug screen
  • Pin-level diagnostic messages
  • Built-in netlist browser
  • Set guards
  • Drive pin values
  • Re-compile & run tests
  • Wiggle pins
  • Single step
• Netlist merge
• Netlist browser
• Auto detect JTAG chain w/manual override drag-and-drop feature
• Support for multi-drop linkers
• Support for differential pairs
• Support for unlimited circuit size
• Support for unlimited chains
• BSDL file syntax and semantics checker
• Support for multi-die devices
• Circuit browser
  
• Automatic Test Generation
  
• Familiar notebook style
• onTAP-Specific Interconnect Test
  
• Flexible, reusable, reliable tests
• 1 year technical support (phone & e-mail)

Enhance the capability of onTAP Development by adding the Memory Cluster/Flash Programming option.

 FS -7002 

Available as a Single Seat/Single User

Upgrade to portable license with USB Security Key

OR

Network License

Please inquire about special multiple seat pricing!

Manufacturing Test Only (MTO) W/ ProScan

Designed for manufacturing "test only" environments.

• Restricts access to test development settings and runs all predeveloped onTAP tests
• ProScan debug environment 
  • Netlist overlaid on graphical debug screen
  • Pin-level diagnostic messages
  • Netlist browser
  • Set guards
  • Drive pin values
  • Wiggle pins
  • Single step
• Netlist browser
• Auto detect JTAG chain w/manual override drag-and-drop feature
• Support for multi-drop linkers
• Support for differential pairs
• Support for unlimited circuit size
• Support for unlimited chains
• Support for multi-die devices
• Circuit browser
  
• Automatic Test Generation
  
• onTAP-Specific Interconnect Test
  
• Flexible, reusable, reliable tests
• 1 year technical support (phone & e-mail)

Be sure to include Memory Cluster Test/Flash Programming option if enabled on Development system

FS-9502

Available as a Single Seat/Single User

Upgrade to portable license with USB Security Key

OR

Network License

Please inquire about special multiple seat pricing!

onTAP DLL

Enables the use of third party test executives

• LabVIEW™ ready
• Run onTAP tests linked to third party test executives.
• DLL can be used with USB Node Locked license or onTAP Network License
• onTAP Network License Manager provides access to onTAP over your network
• Secure, portable, flexible license solutions
• 1 year technical support (phone & e-mail)

Make sure to include Memory Cluster Test/Flash Programming option if enabled on Development system

FS-9402

Available as a Single Seat/Single User

Upgrade to portable license with USB Security Key

OR

Network License

Please inquire about special multiple seat pricing!

onTAP Options

Enhance your tests and increase flexibility

• Flynn Systems’ Thorough Interconnect Test
• Cluster test model development for testing of non-JTAG memory and flash devices
• Design for Testability (DFT) recommendations for board redesigns
• Expert evaluation of your board test results and online assistance with debug.
• BSDL syntax verification to IEEE 1149.1b Boundary Scan Specification

FS-TD

Please call for pricing and timing.  We are very sensitive to our customers needs, and want to ensure we provide you with the most accurate, fairest quote and expectations.

Memory Cluster Test

• High-level DTS test language provides flexible, reusable test models for non-JTAG devices

Flash Programming

• Uses DTS models to program FLASH devices

FS-7100

Allows onTAP to move to any Windows 2000, XP, or Vista machine.

FS-7003

• Install and run onTAP on your network with a secure, Windows based network manager
• Enables multiple users on the same network to share onTAP

FS-9005

Volume license discounts available

• Adjustable TCK Clock 280KHz – 15MHz + 28.8MHz
• Dual channel – run two JTAG chains from one cable
• Auto sensing voltage through VREF for devices operating from 1.8V to 5V
• External VREF 1.8V – 4.5V
• Connect to popular Xilinx and Altera style headers, or use flying leads
• Program Flash in less time than standard cables
• Test and program multiple chains at high speeds
• Cut test and programming times by at least 30%
• Hot plug and play

FS-9165

$785.00*

Includes one year warranty on manufacturer defects.

• Serialize up to 4 chains/board regardless of IO voltages
• Daisy chain Serializer and GPIO
• 196 GPIO drive and capture test points

FS-9180

$1,995.00*

onTAP Component Descriptions:

Test Development System (Automatic test generation of TAP integrity and interconnect tests based on project netlists and BSDL files. Includes BSDL syntax checking, BSDL/CKT matching, jumper management, pin constraints, Make program for adaptor files, testability information, test and programming cable selection, Test Palette selections, diagnostic messages, test reports and tool suites, user-defined tests (BIST), script and command files, development and eebug tools, virtual pints, transparency and Bus Management. Outputs SVF test format files.)

The Manufacturing Test Only screen provides the same access to all test and diagnostic information as the full development system, but restricts use to the test screens and restricts access to menu items that could alter the tests.

Run-time DLL System and Scan Sequencer (Runs tests and presents diagnostics independently of Test Development; Includes breakpoints, loop control, plus a screen for manufacturing test and burn-in.)

Netlist Browser, Application Signal Sampling Viewer and Pin Wiggler (Users may browse through net lists and may sample and view system level application signals, based on JTAG SAMPLE instruction, at any circuit location. A pin wiggler enables user to set any pin output value and to read pin input values.)

Memory and Cluster Test (Serializes and scans vector tests through boundary scan devices and chains. Vector tests for logic/memory devices are created with high-level, reusable DTS program models which may be tailored for application-specific purposes.)

DTS – Digital Test Syntax (A high level test programming language providing program flow control, direct pin control, variables, sub-routines and manipulation of pin groups.)

FLASH Programming (Uses the Memory and Cluster Test option, and DTS to program FLASH; especially suited for FLASH boot code.)

Serial Vector Format (SVF – an industry standard representation of boundary scan data extended for use with onTAP.)

Virtual Pins, Transparency and Bus Management (Virtual pins allows onTAP to "reach through" resistors and buffers to connect scannable and cluster pins. Virtual Pins also dynamically manages direction and enable control pins when accessible.