Welcome to the onTAP JTAG Blog

Flynn Systems Selects Keyware Technology Co., Ltd. as Chinese onTAP Reseller August 2, 2011

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onTAP SUMMER SALE!!! June 22, 2011

  Download the PDF by clicking here. When you purchase any onTAP Boundary Scan Software license, we are giving you the option to add another license to your package for FREE*.  That’s right, FREE!  Buy a development seat for the lab, or an MTO for manufacturing, and get another one for a co-worker. You have [...]

Boundary Scan that Fits Your Budget August 23, 2010

I thought it was important to post something about onTAP being the perfect boundary scan solution for any JTAG user, but especially those in budget critical situations after some weekend reading brought me across a couple of articles in Electronics Weekly about boundary scan useage and budgetary demands.  One article from April 28, 2010 titled Boundary Scan [...]

onTAP Supports IEEE 1149.6! May 14, 2010

As we have promised our users, Flynn Systems continues to develop and add new features to onTAP Boundary Scan Software.  These new features vastly improve onTAP’s capability, enabling onTAP users to do more with less.  We had been developing support for IEEE 1149.6 for several months, and at the end of April, we were able to [...]

Groundhog Day Sale February 2, 2010

When you purchase any onTAP Boundary Scan Software license, we are giving you the option to add another license to your package for FREE*. That’s right, FREE. Buy a development seat for the lab, or an MTO for manufacturing, and get another one for a co-worker. You have your choice of an MTO or DLL.

Happy New Year – Welcome 2010 January 18, 2010

We hope everyone is off to a strong and promising 2010.   By all signs, it appears that this year will deliver new innovations and products to the electronics market.  We certainly are excited to hear about our customers new projects and are looking forward to sharing our new developments with you through out the course [...]

Properly Managing Common Tri-State Control Cells Boosts Fault Coverage December 16, 2009

We are constantly exposed to new situations in boundary scan test and new approaches to using boundary scan to achieve better test fault coverage. One item standing in the way of higher, more accurate fault coverage is common tri-state control cells.

Accepting New Turnkey JTAG Projects November 17, 2009

We insure that your boundary scan tests are maximized for the highest possible fault coverage, are completely debugged, and are ready to put in the hands of test engineers on the manufacturing floor, so all they have to do is “press a button.”
We support our tests and we will support your manufacturer by answering questions and bringing them up-to-speed with boundary scan test and onTAP.

JTAG.TECT Delivers onTAP to Russian Customers November 9, 2009

Current and potential customers of onTAP Boundary Scan Solutions, and onTAP Series 4000 are able to use some of StarTest’s hardware and software solutions (DIMM/SODIMM External Modules, TAP Distributor and Bridge-For-Testability hardware tools, Operator Fault Spotlight software tool), as built-in features of the onTAP Boundary Scan Solution, usable throughout the users’ product lifecycle, including volume manufacturing and in-the-field troubleshooting and repair.

onTAP BIST (Built In Self Test) November 4, 2009

Tests may be defined in script files which may then be translated into executable Serial Vector Format (SVF) files. The general approach is to place all of the required BSDL files into a folder and then to relate the BSDL files to circuit locations in declarations at the beginning of the script file. Once BIT_STRINGS are [...]