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	<title>Flynn Systems &#187; Product News</title>
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		<title>onTAP SUMMER SALE!!!</title>
		<link>http://www.flynn.com/product-news/ontap-summer-sale/</link>
		<comments>http://www.flynn.com/product-news/ontap-summer-sale/#comments</comments>
		<pubDate>Wed, 22 Jun 2011 21:56:09 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[onTAP JTAG Blog]]></category>
		<category><![CDATA[Product News]]></category>

		<guid isPermaLink="false">http://www.flynn.com/?p=3228</guid>
		<description><![CDATA[&#160; Download the PDF by clicking here. When you purchase any onTAP Boundary Scan Software license, we are giving you the option to add another license to your package for FREE*.&#160; That&#8217;s right, FREE!&#160; Buy a development seat for the lab, or an MTO for manufacturing, and get another one for a co-worker. You have [...]]]></description>
			<content:encoded><![CDATA[<p><img src="http://www.flynn.com/wp-content/uploads/image/PICS/SUMMER%20SALE.jpg" alt="Free boundary scan jtag software" style="width: 576px; height: 164px;" /></p>
<p>&nbsp;</p>
<div style="line-height: normal;"><a href="http://www.flynn.com/wp-content/uploads/onTAP SUMMER SALE.pdf">Download the PDF by clicking here.</a></div>
<div style="line-height: normal;"><b><span style="font-size: 12pt;">When you purchase any onTAP Boundary Scan Software license, we are giving you the option to add another license to your package for FREE*.&nbsp; That&rsquo;s right, FREE!&nbsp; Buy a development seat for the lab, or an MTO for manufacturing, and get another one for a co-worker. You have your choice of an MTO or DLL.&nbsp; And, in the spirit of Summer and fun, easy living, we&rsquo;re going to make this offer even better by giving you total flexibility. We will upgrade every license purchased between June 16 and July 20 to a USB Dongle-based Portable license.</span></b></div>
<div style="margin-bottom: 0.0001pt; line-height: normal;"><b><i><u><span style="font-size: 12pt;">But, you have to act fast! This special offer is only available through July 20.</span></u></i></b><b>&nbsp;</b></div>
<div style="margin-bottom: 0.0001pt; line-height: normal;"><span style="font-size: 12pt;"><br />
We look forward to hearing from you.&nbsp; Please feel free to contact us to discuss your boundary scan application. </span></div>
<div style="margin-bottom: 0.0001pt; line-height: normal;"><span style="font-size: 12pt;"><br />
Best regards,</span></div>
<div style="margin-bottom: 0.0001pt; line-height: normal;"><span style="font-size: 12pt;">onTAP Boundary Scan Sales Team</span></div>
<div style="margin-bottom: 0.0001pt; line-height: normal;"><span style="font-size: 12pt;"><a href="../../../../../../"><span style="color: blue;">www.flynn.com</span></a></span></div>
<div style="margin-bottom: 0.0001pt; line-height: normal;"><span style="font-size: 12pt;"><a href="mailto:sales@flynn.com"><span style="color: blue;">sales@flynn.com</span></a></span></div>
<div style="margin-bottom: 0.0001pt; line-height: normal;"><span style="font-size: 12pt;">&nbsp;+1 (603) 598-4444</span></div>
<p>&nbsp;</p>
<p>&nbsp;</p>
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		<title>Boundary Scan that Fits Your Budget</title>
		<link>http://www.flynn.com/product-news/boundary-scan-that-fits-your-budget/</link>
		<comments>http://www.flynn.com/product-news/boundary-scan-that-fits-your-budget/#comments</comments>
		<pubDate>Mon, 23 Aug 2010 19:03:42 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[onTAP JTAG Blog]]></category>
		<category><![CDATA[Product News]]></category>
		<category><![CDATA[Boundary Scan Budget]]></category>
		<category><![CDATA[Budget JTAG]]></category>
		<category><![CDATA[JTAG Software on a budget]]></category>

		<guid isPermaLink="false">http://www.flynn.com/?p=3106</guid>
		<description><![CDATA[I thought it was important to post something about onTAP&#160;being the perfect boundary scan solution for any JTAG&#160;user, but especially those in budget critical situations after some weekend reading brought me across a couple of articles in Electronics Weekly about boundary scan useage and budgetary demands.&#160; One article from April 28, 2010 titled Boundary Scan [...]]]></description>
			<content:encoded><![CDATA[<p>I thought it was important to post something about onTAP&nbsp;being the perfect boundary scan solution for any JTAG&nbsp;user, but especially those in budget critical situations after some weekend reading brought me across a couple of articles in <a href="http://www.electronicsweekly.com/Home/">Electronics Weekly</a> about boundary scan useage and budgetary demands.&nbsp; One article from April 28, 2010 titled <i><u>Boundary Scan on a Budget</u> </i> <i><a href="http://www.electronicsweekly.com/Articles/2010/04/28/48512/boundary-scan-on-a-budget.htm">(http://www.electronicsweekly.com/Articles/2010/04/28/48512/boundary-scan-on-a-budget.htm</a>) </i>and another June 29, 2010 article <i><u>Agilent gets serious about JTAG test</u></i> describe how users are seeing an increased use of boundary scan brings down costs.&nbsp; However,&nbsp; the article fails to point out any real costs or even estimated costs for boundary scan tools.&nbsp; <strong>We all know that this stuff isn&#8217;t inexpensive, but how much can one expect to pay?&nbsp; </strong><u><strong>With onTAP, you will receive a complete boundary scan system for under $15,000.</strong></u> Read on for more details.</p>
<p>As you may already be aware, onTAP regularly competes with all the other boundary scan vendors, world-wide, and wins.&nbsp; In many cases, other boundary scan customers are the same as onTAP customers. &nbsp;In many other cases, onTAP has been selected to replace other boundary scan systems because of the great value and support it delivers, at a substantially lower cost, thus enabling more widespread deployment.&nbsp; &nbsp;</p>
<div>&nbsp;</div>
<div>While the other systems are sold piecemeal, onTAP is an all inclusive<strong> netlist based boundary scan</strong> system that enables users to <strong>develop and run automated interconnect tests, debug the tests</strong> using ProScan, the built-in graphical debug environment, capture pin-level diagnostic messages, view reports and edit tests.&nbsp;<strong> IEEE 1149.1 and 1149.6 compliant</strong>, onTAP also automatically accounts for AC coupled circuits.&nbsp; Moreover, onTAP enables users to develop and run reliable, reusable memory cluster tests, program flash and control I2C buses.&nbsp; There is a built-in library of buffers, resistors, and transceivers, while more complex models are kept in our library. Our models are developed free of charge and can be customized to a user&rsquo;s particular needs. &nbsp;All models are completely reusable across different projects and just as importantly, offer great flexibility making it simple to tailor to a particular user&rsquo;s needs.</div>
<div>&nbsp;</div>
<div>The models are written in a C-like language called DTS, a legacy of Flynn Systems&rsquo; GenRad and Automatic Test Generation roots, and are easily edited by any user with a simple working knowledge of C and the accompaniment of the DTS Programming Manual.</div>
<div>&nbsp;</div>
<div>That, in a nut-shell is onTAP.&nbsp; So, what makes it attractive for the value-seeking user?&nbsp; A complete onTAP Boundary Scan system is at least 20% less the lowest cost comparable product and we offer a 30 Day no obligation evaluation. &nbsp;&nbsp;<strong>The average cost of a complete onTAP Boundary Scan System, including a dual channel HighSpeed USB JTAG controller is under $15,000 USD.</strong></div>
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		<title>onTAP Supports IEEE 1149.6!</title>
		<link>http://www.flynn.com/product-news/ontap-is-ieee-1149-6-enabled/</link>
		<comments>http://www.flynn.com/product-news/ontap-is-ieee-1149-6-enabled/#comments</comments>
		<pubDate>Fri, 14 May 2010 20:26:45 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[onTAP JTAG Blog]]></category>
		<category><![CDATA[onTAP Usage]]></category>
		<category><![CDATA[Press Releases]]></category>
		<category><![CDATA[Product News]]></category>

		<guid isPermaLink="false">http://www.flynn.com/?p=2979</guid>
		<description><![CDATA[As we have promised our users, Flynn Systems continues to develop and add new features to onTAP Boundary Scan Software.&#160; These new features vastly improve onTAP&#8217;s capability, enabling onTAP&#160;users to do more with less.&#160; We had been developing support for IEEE 1149.6 for several months, and at the end of April, we were able to [...]]]></description>
			<content:encoded><![CDATA[<p>As we have promised our users, Flynn Systems continues to develop and add new features to onTAP Boundary Scan Software.&nbsp; These new features vastly improve onTAP&#8217;s capability, enabling onTAP&nbsp;users to do more with less.&nbsp; We had been developing support for IEEE 1149.6 for several months, and at the end of April, we were able to fully implement the IEEE 1149.6 standard into the current version of onTAP.&nbsp; It has been rigorously field tested, and we are proud to release it to our user community. Please download the newest version of onTAP, and feel free to begin developing truly complete, robust JTAG&nbsp;tests for your projects with IEEE 1149.6 capability.</p>
<p><span style="font-size: larger;"><strong>onTAP Boundary Scan Software Now Supports IEEE 1149.6</strong></span></p>
<div>&nbsp;</div>
<div><strong><span style="font-size: 11pt;">NASHUA, NH</span></strong><span style="font-size: 11pt;"> May 14, 2010 &#8211; Flynn Systems Corp is proud to announce the latest version of onTAP is IEEE 1149.6 compliant.&nbsp;The implementation of IEEE 1149.6 greatly enhances onTAP&rsquo;s scope and capability, while delivering more JTAG test coverage and power to current and interested onTAP users. </span></div>
<div>&nbsp;</div>
<div><span style="font-size: 11pt;">According to Ryan Flynn, onTAP Marketing Manager, &ldquo;As Xilinx and Altera begin to implement IEEE 1149.6 protocols in their latest designs, including the Virtex 6 and Aria GX devices (respectively), it was increasingly important for us to enable onTAP users with every bit of capability so they could harness the full test potential of these new devices and implement them into their designs.&nbsp;onTAP&rsquo;s IEEE 1149.6 implementation has been field tested in very intense and rigorous applications with Intel.&nbsp;Intel&rsquo;s success has been a heck of proving ground for onTAP.&rdquo;</span></div>
<div>&nbsp;</div>
<div><span style="font-size: 11pt;">As implementation of IEEE 1149.1 and 1149.X Boundary Scan testing becomes more widespread, greater flexibility, faster speeds, and smoother operation are needed.&nbsp;Flynn Systems&rsquo; commitment to its Customers has always been to keep onTAP a live software by continuing to support, develop, and enhance onTAP tools that capitalize on JTAG test capability. The 1149.6 implementation is another demonstration of Flynn&rsquo;s commitment to its user base. </span></div>
<div><span style="font-size: 11pt;">onTAP&rsquo;s new update expands users&rsquo; test capabilities, flexibility, and further enhances test fault coverage in a number of ways.&nbsp;Most apparent is the productivity gain achieved by testing to both IEEE 1149.1 and IEEE 1149.6 standards.&nbsp;The IEEE 1149.6 feature enables users to test AC Coupled circuits and differential pairs to the industry standard protocol.&nbsp;Adding these two elements to a test not only increases test fault coverage, but also creates a more robust and reliable test by incorporating additional aspects of the board in the test. </span></div>
<div>&nbsp;</div>
<div><span style="font-size: 11pt;">Flynn Systems continues its pursuit of delivering cost-effective, complete, robust JTAG test and programming software packages with attentive and dedicated technical support to its current users and anyone interested in a feature-rich, high-value complete JTAG solution at a reasonable price. </span></div>
<div>&nbsp;</div>
<div><b><span style="">About Flynn Systems:</span></b></div>
<div><span style="">Flynn Systems began delivering Automatic Test Generation Solutions to the ATE market as FS-ATG in 1986.&nbsp;In late 1999, they transitioned to the boundary scan market with onTAP and have provided test, debug, and programming solutions for the boundary scan test standard (JTAG IEEE 1149.1) for over ten years.&nbsp;Their onTAP software package is designed for completely automated boundary scan testing for devices of all levels of complexity on printed circuit boards (PCB) and non-boundary scan devices interacting with the scan enabled devices.&nbsp;onTAP&rsquo;s functionality also includes the capability to program FLASH devices using only the onTAP USB Test and Programming Cable (HighSpeed included). Flynn Systems Corp. provides high level test suites and the highest fault coverage available with a powerful ATG engine: all backed by fast, responsive technical support.&nbsp;Its satisfied customers include Intel, Qualcom, Harris RF, Benchmark Electronics, Raytheon, L-3 Communications, Cadence Design, Teradyne, Checkpoint Systems, Ulticom, and University of Arizona.&nbsp;Flynn Systems&rsquo; onTAP provides boundary scan services for university research, avionics, defense systems, consumer goods, and medical electronics.&nbsp;It is based in New Hampshire with distributors and partners in Europe and Asia. </span></div>
<div>&nbsp;</div>
<div><span style="">Those interested are invited to download a free 30 day evaluation software package with full technical support available at </span><a href="../../../../../../"><span style="">www.flynn.com</span></a><span style="">.</span></div>
<p>&nbsp;</p>
<p>&nbsp;</p>
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		<title>Accepting New Turnkey JTAG Projects</title>
		<link>http://www.flynn.com/product-news/turnkey-jtag-projects/</link>
		<comments>http://www.flynn.com/product-news/turnkey-jtag-projects/#comments</comments>
		<pubDate>Tue, 17 Nov 2009 20:58:35 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[onTAP JTAG Blog]]></category>
		<category><![CDATA[Product News]]></category>
		<category><![CDATA[Boundary Scan JTAG Turnkey Solution]]></category>
		<category><![CDATA[boundary scan test]]></category>
		<category><![CDATA[JTAG Test]]></category>
		<category><![CDATA[pre-developed tests]]></category>
		<category><![CDATA[turnkey boundary scan test]]></category>
		<category><![CDATA[turnkey JTAG test]]></category>

		<guid isPermaLink="false">http://www.flynn.com/?p=2747</guid>
		<description><![CDATA[We insure that your boundary scan tests are maximized for the highest possible fault coverage, are completely debugged, and are ready to put in the hands of test engineers on the manufacturing floor, so all they have to do is “press a button.”
We support our tests and we will support your manufacturer by answering questions and bringing them up-to-speed with boundary scan test and onTAP. ]]></description>
			<content:encoded><![CDATA[<p><span style="font-size: small;"><span style="line-height: 115%;">Flynn Systems wants to let our users know that we are accepting new JTAG / Boundary Scan projects for Q1-2/10</span></span></p>
<div><span style="font-size: small;">While our standard Technical Support provides assistance with test and development issues, our boundary scan test development services go beyond onTAP&nbsp;technical support services by taking the<strong> boundary scan / JTAG test development and debugging</strong> off your plate, allowing you to focus your undivided attention on your core business issues as you move through development and prototyping into manufacturing.&nbsp;</span></div>
<div><span style="font-size: small;">&nbsp;</span></div>
<div><span style="font-size: small;"><span style="line-height: 115%;">Our Boundary Scan Test Development Service is very popular with both existing and new customers.</span>&nbsp; In fact, 4 out of 5 customers who have used onTAP boundary scan test development services once, immediately recognize the cost and time savings, and return within 4 months with another project.&nbsp; By turning over your JTAG / Boundary Scan test developm</span>ent to Flynn Systems, you are able focus on other aspects of your project without being distracted by developing and debugging boundary scan tests.</div>
<div>&nbsp;</div>
<div>We ensure that your boundary scan tests are maximized for the highest possible fault coverage, are completely debugged, and are ready for the manufacturing floor, so the end user only has to &ldquo;press a button.&rdquo;</div>
<div>&nbsp;</div>
<div>We support our tests and we will support you and/or your contract manufacturer by answering questions and bringing all parties involved up-to-speed with boundary scan test and onTAP procedures and reports.&nbsp;</div>
<div>&nbsp;</div>
<div>Our test development features:</div>
<ul>
<li>&nbsp;JTAG TAP infrastructure tests.</li>
<li>Interconnect tests including detection of opens, shorts, stuck-at, bus-wire, pull-up/down related faults.</li>
<li>Memory tests</li>
<li>Cluster tests of non-JTAG components</li>
<li>Flash programming</li>
<li>In-system programming configuration</li>
<li>Pin-level diagnostics</li>
<li>On-going support</li>
</ul>
<div style="margin-left: 0.5in; text-indent: -0.25in;">&nbsp;</div>
<div>All of our tests are comprehensive, accurate, supported and reliable.</div>
<div>&nbsp;</div>
<div>Call us today to get started.</div>
<p><a href="http://www.flynn.com/boundary-scan-products-and-services/ontap-turn-key-service/"><strong>Click here to learn more about onTAP Turnkey Service</strong></a></p>
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		<title>Boundary-Scan Lösung präsentiert sich  auf der Productronica</title>
		<link>http://www.flynn.com/jtag-blog/boundary-scan-losung-prasentiert-sich-auf-der-productronica/</link>
		<comments>http://www.flynn.com/jtag-blog/boundary-scan-losung-prasentiert-sich-auf-der-productronica/#comments</comments>
		<pubDate>Wed, 28 Oct 2009 14:15:33 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[German Language News]]></category>
		<category><![CDATA[onTAP JTAG Blog]]></category>

		<guid isPermaLink="false">http://www.flynn.com/?p=2656</guid>
		<description><![CDATA[ATEcare demonstriert, wie Sie onTAP in Verbindung mit einem High-End Funktions-Test einsetzen können.  Zusätzlich stellt ATEcare Test- und Inspektionskonzepte AOI, SPI, ICT und AXI in Halle A1 Stand 454 aus.]]></description>
			<content:encoded><![CDATA[<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;"><span style="">ATEcare, die deutsche Vertretung von Flynn Systems Corporation zeigt und erkl&auml;rt Ihnen die neueste onTAP-Software zusammen mit dem ebenfalls neu entworfenen </span><u><span style="">onTAP&nbsp;HighSpeed USB Dual Channel JTAG Test- und Programmierkabel</span></u><span style=""> in <strong><span style="">Halle A1 Stand 452</span></strong>.&nbsp;</span></div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;">&nbsp;</div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;"><span style="">ATEcare demonstriert, wie Sie <strong><span style="">onTAP&nbsp;</span></strong>in Verbindung mit einem <strong><span style="">High-End Funktions-Test </span></strong><strong><span style="">einsetzen k&ouml;nnen</span></strong>.&nbsp; Zus&auml;tzlich stellt ATEcare Test- und Inspektionskonzepte <strong><span style="">AOI, SPI, ICT und AXI</span></strong> in <strong><span style="">Halle A1 Stand 454 </span></strong><strong><span style="">aus.</span></strong></span></div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;">&nbsp;</div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;"><span style="">Bitte besuchen Sie uns, sprechen Sie mit unseren Vertretern um mehr &uuml;ber die Einsatzm&ouml;glichkeiten von onTAP&nbsp;zu erfahren. Nutzen Sie das Know-how von ATEcare in allen Bereichen des Fertigungstests. </span></div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;">&nbsp;</div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;"><span style=""><a href="http://productronica.com/">Productronica</a> ist, &quot;The world&rsquo;s leading trade fair for all aspects of innovative electronics production &ndash; with an almost 100% share of high-profile trade visitors.&quot;</span></div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;">&nbsp;</div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;"><img width="573" height="85" src="/wp-content/uploads/image/productronica.png" alt="" /></div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;"><strong><span style="">Halle A1 Stand 452</span></strong></div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;">&nbsp;</div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;"><span style="">ATEcare bietet onTAP&nbsp;Anwendern in Europa einen umfassenden Support in allen Bereichen: Service, Applikation und Training.</span></div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;"><span style="">Besuchen Sie ATEcare im Internet oder nehmen Sie direkt Kontakt auf:&nbsp;</span></div>
<div style="background: white none repeat scroll 0% 0%; -moz-background-clip: border; -moz-background-origin: padding; -moz-background-inline-policy: continuous; vertical-align: top;"><a href="http://www.atecare.net/"><span style="">www.ATEcare.net</span></a><br />
<a href="javascript:location.href='mailto:'+String.fromCharCode(105,110,102,111,64,65,84,69,99,97,114,101,46,99,111,109)+'?'"><span style="">info@ATEcare.com</span></a></div>
<p>&nbsp;</p>
<p>&nbsp;</p>
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		<title>Visit onTAP Boundary Scan / JTAG at Productronica</title>
		<link>http://www.flynn.com/product-news/visit-ontap-jtag-test-at-productronica/</link>
		<comments>http://www.flynn.com/product-news/visit-ontap-jtag-test-at-productronica/#comments</comments>
		<pubDate>Tue, 27 Oct 2009 14:00:43 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Product News]]></category>

		<guid isPermaLink="false">http://www.flynn.com/?p=2643</guid>
		<description><![CDATA[onTAP boundary scan / JTAG test software will be on display at Productronica in Munich.  Visit Hall A1 Stand 452 to learn more about JTAG and Functional test. ]]></description>
			<content:encoded><![CDATA[<p>ATE&nbsp;Care, Flynn Systems Corporation&#8217;s German distributor of onTAP&nbsp;Boundary Scan Software, will exhibit onTAP&nbsp;Boundary Scan Software along with the new <a href="http://www.flynn.com/product-news/high-speed-boundary-scan-testing-programming/">onTAP&nbsp;HighSpeed USB Dual Channel JTAG Test and Programming cable</a> at Productronica <br />
November 10 &#8211; 13 in <strong>Hall A1 Stand 452</strong>.&nbsp;</p>
<p>ATE&nbsp;Care will offer displays and demonstrations of <strong> onTAP&nbsp;Boundary Scan Software and Hardware </strong>in <strong>Hall A1 Stand 452</strong> in conjunction with their <strong>High-End Functional Test </strong>exhibit.&nbsp; They will also exhibit their <strong>AOI, SPI, ICT, and AXI</strong> capabilities in <strong>Hall A1 Stand 454</strong>.&nbsp;</p>
<p>Please stop by to speak with our representatives and learn more about onTAP&nbsp;and how it coupled with ATE Care&#8217;s experience and vast knowledge base of boundary scan and functional test will improve your boundary scan / JTAG test and debugging efforts.</p>
<p><a href="http://productronica.com/">Productronica</a> is, &quot;The world&#8217;s leading trade fair for all aspects of innovative electronics production &#8211; with an almost 100% share of high-profile trade visitors.&quot;</p>
<p><a href="http://productronica.com/en/home"><img width="573" height="85" src="/wp-content/uploads/image/productronica.png" alt="Productronica logo and trade show information - visit onTAP at Hall A1 Stand 452" /></a></p>
<p><strong>Hall A1 Stand 452</strong></p>
<p>ATE&nbsp;Care provides onTAP&nbsp;users in Europe with extensive onTAP&nbsp;boundary scan knowledge and ATE&nbsp;test services, along with specialized German Language support services for onTAP&nbsp;Boundary Scan Test Software.</p>
<p>Visit ATE&nbsp;Care:&nbsp;</p>
<p><a href="http://www.ATEcare.net">www.ATEcare.net</a><br />
<a href="javascript:location.href='mailto:'+String.fromCharCode(105,110,102,111,64,65,84,69,99,97,114,101,46,99,111,109)+'?'">info@ATEcare.com</a></p>
<p>&nbsp;</p>
<h2><a href="http://www.atecare.net"><img src="/wp-content/uploads/image/ATEcare%20Logo.bmp" style="width: 182px; height: 91px;" alt="" /></a>&nbsp; <strong>and &nbsp; &nbsp; &nbsp; </strong><a href="http://www.flynn.com/boundary-scan-products-and-services/"><img src="/wp-content/uploads/image/ontap%20logo.jpg" style="width: 161px; height: 93px;" alt="" /></a></h2>
<p>&nbsp;</p>
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		<title>30 MHz High Speed Boundary Scan Testing &amp; Programming</title>
		<link>http://www.flynn.com/product-news/high-speed-boundary-scan-testing-programming/</link>
		<comments>http://www.flynn.com/product-news/high-speed-boundary-scan-testing-programming/#comments</comments>
		<pubDate>Thu, 17 Sep 2009 14:29:43 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[onTAP JTAG Blog]]></category>
		<category><![CDATA[Product News]]></category>

		<guid isPermaLink="false">http://www.flynn.com/?p=2456</guid>
		<description><![CDATA[onTAP HighSpeed USB boundary scan test and programming device enables onTAP users to test multiple JTAG chains at speeds up to 30MHz.]]></description>
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<div><strong><span style="font-size: 10pt; line-height: 120%;">Boundary scan testing </span></strong><span style="font-size: 10pt; line-height: 120%;">and programming is gaining popularity with designers, developers, and as a result, manufacturers.&nbsp;It is the responsibility of boundary scan test vendors to develop and provide end users with tools that are faster, more flexible, more robust, and more cost effective those previously available.&nbsp;</span></div>
<div>&nbsp;</div>
<div><span style="font-size: 10pt; line-height: 120%;">The onTAP HighSpeed USB JTAG Test and Programming Cable delivers onTAP Boundary Scan software users a fast, flexible, PC based, high speed test and programming tool.&nbsp;&nbsp; </span><span style="font-size: 10pt; line-height: 120%;">Flynn Systems designed this device from the ground up, with usability in mind.</span></div>
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<td>
<p><a href="http://www.flynn.com/boundary-scan-products-and-services/highspeed-jtag-test-and-programing-cable/"><img width="254" height="232" alt="onTAP Boundary Scan Self Adjusting 30 MHz Dual Channel USB JTAG test and programming " src="/wp-content/uploads/image/onTAP_HighSpeed_JTAG_Test_and_Programming_Cable.jpg" /></a><span style="font-size: smaller;"><em><br />
            </em></span></p>
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<div>&nbsp;</div>
</p></div>
<div><span style="font-size: 10pt; line-height: 120%;">This new JTAG controller is self powered at 3.3.V and built with two self adjusting JTAG ports, both capable of test and programming speeds up to 28.8MHz.&nbsp;It also has an external voltage, adjustable from 1.8V to 4.5V.&nbsp;The new USB driver for the onTAP HighSpeed USB JTAG test and programming cable enables users to test multiple JTAG chains faster, smoother, with more responsiveness.&nbsp;Aside from all of the features, one of the greatest benefits is this new cable cuts flash programming times by half.&nbsp;</span></div>
<div>&nbsp;</div>
<div><span style="font-size: 10pt; line-height: 120%;">The onTAP HighSpeed USB JTAG Test and Programming Cable can be run with other of the same cables to expand test and programming capability. </span></div>
<div>&nbsp;</div>
<div><a href="http://www.flynn.com/boundary-scan-products-and-services/highspeed-jtag-test-and-programing-cable/"><strong><span style="font-size: 10pt; line-height: 120%;">Learn more about this boundary scan device.</span></strong></a></div>
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<p>&nbsp;</p>
<p>&nbsp;</p>
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		<title>Expand Your Boundary Scan Tests: Tap Serializer and GPIO is Here</title>
		<link>http://www.flynn.com/product-news/expand-your-boundary-scan-tests-tap-serializer-and-gpio-is-here/</link>
		<comments>http://www.flynn.com/product-news/expand-your-boundary-scan-tests-tap-serializer-and-gpio-is-here/#comments</comments>
		<pubDate>Thu, 13 Aug 2009 17:54:10 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[onTAP JTAG Blog]]></category>
		<category><![CDATA[Product News]]></category>
		<category><![CDATA[boundary scan GPIO]]></category>
		<category><![CDATA[boundary scan tap serializer]]></category>
		<category><![CDATA[JTAG expander]]></category>

		<guid isPermaLink="false">http://www.flynn.com/?p=2373</guid>
		<description><![CDATA[onTAP Serializer and GPIO Board is a cost effective tool for testing, programming, and debugging multiple boundary scan/JTAG applications.  The board also provides 196 drive and capture points.]]></description>
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<p>Flynn Systems is pleased to unveil its newest hardware tool for boundary scan/JTAG testing: <strong>The onTAP&nbsp;Serializer and GPIO&nbsp;board.&nbsp;</strong></p>
<p>The onTAP&nbsp;Serializer and GPIO&nbsp;Board is a true &quot;utility board&quot; for the simple organization and execution of multiple boundary scan chains and applications.&nbsp; This board is designed for testing, programming, and debugging up to four chains per <strong>Serializer and GPIO</strong> <strong>Board</strong> by providing four JTAG taps that receive either a ribbon cable or flying lead link from the user&#8217;s target board(s).&nbsp; This enables users to easily test and program multiple boards with individualized tests for each unit under test (UUT).</p>
<p>The Serializer and GPIO&nbsp;board can also be daisy chained to another Serializer and GPIO Board, further expanding test capability.</p>
<p>Furthermore, the onTAP&nbsp;Serializer and GPIO board provides 196 easily accessible CPLD based drive and capture points to expand your debug capability.&nbsp;</p>
<p>With this new tool for onTAP, boundary scan users with the need to test, debug, and/or program multiple applications at once now have a cost effective, flexible, organized means for implementing and executing their boundary scan test strategy.</p>
<p>Click <a href="http://www.flynn.com/products/ontap-serializer-and-gpio-board/">here to learn more</a>.</p>
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<td><a href="http://www.flynn.com/products/ontap-serializer-and-gpio-board/"><img align="top" src="/wp-content/uploads/image/PICS/Boundary_Scan_Serializer_and_GPIO.jpg" alt="boundary scan tap serializer and GPIO for JTAG test" style="width: 232px; height: 193px;" /></a></td>
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<p>&nbsp;</p>
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		<title>PC Based Parallel JTAG Testing</title>
		<link>http://www.flynn.com/product-news/2293/</link>
		<comments>http://www.flynn.com/product-news/2293/#comments</comments>
		<pubDate>Wed, 22 Jul 2009 19:59:13 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[onTAP JTAG Blog]]></category>
		<category><![CDATA[Product News]]></category>

		<guid isPermaLink="false">http://www.flynn.com/uncategorized/2293/</guid>
		<description><![CDATA[&#160;Flynn Systems Corp announces support for PC based parallel JTAG testing and programming.&#160;Keeping with the value based approach to delivering boundary scan test solutions, Flynn Systems has harnessed the power of the multi-core processor to divide tasks, enabling users to simultaneously test and program multiple applications without speed penalties.&#160; This type of functionality adds to [...]]]></description>
			<content:encoded><![CDATA[<p>&nbsp;<span style="font-size: 10pt;">Flynn Systems Corp announces support for PC based parallel JTAG testing and programming.&nbsp;Keeping with the value based approach to delivering boundary scan test solutions, Flynn Systems has harnessed the power of the multi-core processor to divide tasks, enabling users to simultaneously test and program multiple applications without speed penalties.&nbsp;</span></p>
<div><span style="font-size: 10pt;">This type of functionality adds to the overall ease of use and increases productivity in a design, prototype, and especially manufacturing environment. Ryan Flynn, Director of Marketing for Flynn Systems states, &ldquo;Our customers have been searching for a way to make this possible with onTAP. We have explored PXI and PCIe, which are still developments we intend to offer, but the greatest need was for our customers to have increased flexibility in test and programming in the design, prototype, and manufacturing environment at a very low cost.&rdquo; The release of this function precedes the anticipated arrival of the new 30MHz USB JTAG Test and Programming cable Flynn Systems plans to release mid-summer 2009.</span></div>
<div>&nbsp;</div>
<div><span style="font-size: 10pt;">Flynn Systems continues to develop and deliver new tools that improve user experience by making tools that expand the capability one has with IEEE 1149.X JTAG standards while maintaining their philosophy of providing the best possible tools at the best possible price. Keep an eye out for new developments from Flynn Systems throughout 2009.</span></div>
<p>Learn more about the practical application of onTAP PC&nbsp;Based Parallel Testing &#8211; <a href="http://www.flynn.com/boundary-scan-jtag-support/new-to-boundary-scan/" target="_blank">click here</a>.</p>
<p>&nbsp;</p>
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		<title>Escape Communications Selects onTAP as its Embedded JTAG Solution</title>
		<link>http://www.flynn.com/product-news/case-study-ontap-chosen-as-embedded-jtag-solution/</link>
		<comments>http://www.flynn.com/product-news/case-study-ontap-chosen-as-embedded-jtag-solution/#comments</comments>
		<pubDate>Fri, 03 Apr 2009 18:00:59 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[onTAP JTAG Blog]]></category>
		<category><![CDATA[onTAP Usage]]></category>
		<category><![CDATA[Product News]]></category>
		<category><![CDATA[boundary scan]]></category>
		<category><![CDATA[embedded JTAG solution]]></category>
		<category><![CDATA[JTAG]]></category>

		<guid isPermaLink="false">https://www.flynn.com/newsite/?p=1433</guid>
		<description><![CDATA[(text version &#8211; download PDF version here) &#160; The challenge: &#160; Escape Communications of Torrance, CA (www.escapecom.com), a trusted provider of point-to-point microwave radio indoor units (IDUs) for commercial telecommunications OEMs and custom advanced signal processing designs for major space and defense contractors, sought to improve their physical user interface for testing, especially during the [...]]]></description>
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<p><span style="font-size: 10pt;">(<strong>text version</strong> &#8211; <a target="_blank" href="/wp-content/uploads/file/NEWS/onTAP_Escape_Case_Study_Embedded_JTAG_Test_Solution(2).pdf">download PDF version here</a>)</span></p>
<p>&nbsp;</p>
<div><big><strong><span style="font-size: 10pt;">The challenge:</span></strong></big></div>
<div>&nbsp;</div>
<div><span style="font-size: 10pt;">Escape Communications of Torrance, CA (<a href="http://www.escapecom.com">www.escapecom.com</a>), a trusted provider of point-to-point microwave radio indoor units (IDUs) for commercial telecommunications OEMs and custom advanced signal processing designs for major space and defense contractors, sought to improve their physical user interface for testing, especially during the manufacturing process.&nbsp; Having already developed a test executive with an intuitive GUI, Escape then needed to eliminate proprietary third party&nbsp; test fixtures, some of which were outdated and unreliable, and integrate reliable, easy to use, and cost-effective test capabilities into their new Automated Test Board (ATB) design.&nbsp;&nbsp; <br />
            </span><span style="font-size: 10pt;"><br />
            </span></div>
<div><span style="font-size: 10pt;">In previous projects, Escape had recognized the high value of comprehensive IEEE 1149.1 tests and had successfully used onTAP software for boundary scan test applications.&nbsp; The major test and development challenges for their current ATB project were limited physical access to the board and limited boundary scan access.&nbsp; &ldquo;Some devices were not able to interface via boundary scan,&rdquo; said Ted Pascaru, Director of Operations for Escape Communications, &ldquo;and other devices required proprietary test and programming methods&hellip;We needed a solution that would make it easier for us, our customers, and manufacturers to access the board and conduct the necessary tests.&rdquo;<br />
            </span></div>
<div>&nbsp;</div>
<div><span style="font-size: 10pt;">Escape set out to develop a method that provided boundary scan access along with the needed access to the devices with special provisions.&nbsp; Such a strategy, Pascaru explained, &ldquo;Would enable our customers, and subsequently our CMs, to implement reliable, user-friendly, cost-effective tests without the need to purchase suites of separate test tools and licenses.&rdquo;</span></div>
<div>&nbsp;</div>
<div><img width="583" height="128" src="/wp-content/uploads/image/for%20News/EXM2L-16%20Reflection.jpg" alt="Escape Communcations Flagship Product EXM2L-16" /></div>
<div><strong>&nbsp;<span style="font-size: xx-small;">The Escape Communications EXM-2L16 is their flagship product offering 16 native T1/E1 tributaries and offering optional built-in switched protection / receive diversity. The EXM-2L16 supports arbitrary bandwidths from 3.5 to 30 MHz&nbsp; and transport capacities from&nbsp; 5 Mbps to 170 Mbps (QPSK to 256 QAM).</span></strong></div>
<div>&nbsp;</div>
<div><big><strong><span style="font-size: 10pt;">The solution:</span></strong></big></div>
<div>&nbsp;&nbsp;</div>
<p>            Escape Communications asked Flynn Systems to help them tackle the challenge of embedding boundary scan tests into their ATB design through the use of readily available, off-the-shelf firmware in order to minimize customization and engineering development costs.&nbsp; Escape selected the FTDI 2232D Dual USB UART/FIFO IC chip for the ATB test interface, the same chip Flynn Systems uses in their USB JTAG Test and Programming cable.&nbsp; Escape and Flynn have both had great success with this particular device due to its versatility and full range of capabilities for test and development purposes.</p>
<p>            The Escape solution confines the necessary test equipment to little more than a common high speed A-A USB 2.0 cable, controlling the embedded FTDI chip through Escape&rsquo;s board design and its own test executive.&nbsp; The result: &ldquo;Now we have created a way to easily access the board and perform all the necessary functions for the different devices on the board.&nbsp; Flynn was easy to work with and open to the idea of embedding a solution,&rdquo; Pascaru noted.&nbsp; Instead of having several cables and test and programming pods interfacing with the board, there is one embedded device connected to the test PC via a standard USB 2.0 port. &nbsp;</p>
<p></p>
<div>&nbsp;</div>
<div><img width="582" height="289" src="/wp-content/uploads/image/for%20News/Escape%20Communications%20Automatic%20Test%20Board%20with%20Embedded%20JTAG%20Test.jpg" alt="Escape Commincation Automatic Test Board with onTAP Embedded JTAG Test Solution" /></div>
<div><span style="font-size: xx-small;">&nbsp;</span></div>
<div><span style="font-size: xx-small;">Escape Communications Automatic Test Board (ATB) with embedded onTAP JTAG test via USB port</span></div>
<div>&nbsp;</div>
<div><strong><big><span style="font-size: 10pt;">How it Works with onTAP:</span></big></strong></div>
<div><span style="font-size: 10pt;"><br />
            </span></div>
<p>            From a single test port, a design, test, or manufacturing test engineer can simply plug the board into an onTAP-enabled PC or laptop, and run a complete suite of pre-developed onTAP boundary scan tests.&nbsp; onTAP&rsquo;s automated test generation delivers the highest possible fault coverage with a graphical debugging environment that provides pin-level diagnostic messages and detailed test reports. Pascaru is pleased with the outcome of the seamless integration of onTAP with Escape&rsquo;s Automated Test Board.&nbsp; The comprehensive test results provided by onTAP enable users to identify and repair faults on boards under test more quickly and easily than ever before.</p>
<div>&nbsp;</div>
<div>
<div><strong><big><span style="font-size: 10pt;">About Escape Communications:</span></big></strong></div>
</p></div>
<p>            Founded in 1998, Escape Communications provides indoor units (IDUs), high-speed modem modules, and Satcom terminals to commercial telecommunications equipment OEMs and major space and defense contractors.&nbsp; Escape has developed an extensive portfolio of communications, signal processing, mixed-signal and embedded processor IP that enables them to offer standard product solutions and custom turnkey design services that are both cost-effective and schedule-efficient.&nbsp; More details can be found at <a href="http://www.escapecom.com" target="_blank">www.escapecom.com</a>.</td>
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