Services offered:

SSP serves as a Benchtop Boundary Scan /JTAG, In-Circuit Test (ICT), and Functional Test support supplier for many diverse industries like High Tech, Medical, Green Tech, and Defense, to name a few.

• Design-For-Testability (DFT) analysis including checking the DFT compliance of customer’s design before board layout. onTAP Boundary Scan/(JTAG) test program development, including on-board programming of CPLD, FPGA, flash, I²C, IEEE 1149.6
• ICT test program development for the Agilent 307X and Teradyne TS and 228X testers
• Functional test program development and system architecture utilizing Agilent and LabView software/hardware solutions; and incorporating Boundary Scan into functional applications.