• Added capability to view Flash verify results using access from Flash Settings Control Panel.
• Added new capability to Flash Control Panel for start and end flash programming address settings.
• Adjusted dimensions on Test screen

• Corrects problem in MID-STATE shorts test where some resistive shorts faults were not detected.
• Corrects problem with Wait Cursor not terminating on TestGen page.

• Upgrades FLASH Control Panel to include an optional number of TCK clocks between programming addresses, allowing more time for programming operations.
• Upgrades IEEE 1149.6 AC testing so that jumpers are not required across capacitors. Capacitors in the test should be matched to onTAP’s CAPACITOR model on the Non Scan page.  Loopback connections are best handled using a ProjectPinMap.txt model of a connectors pin-to-pin connections. The ProjectPinMaps file is located in a user’s project folder.

• Upgrades PlayRecord feature for flash programming.
• Upgrades ability to assign net names to pin in Compose Netlist tool.
• Upgrades handling of binary flash data files.
• Upgrades DLLs.

• Provides capability to access EXTENDED_ADDRESS, SEGMENT_ADDRESS and low word address, LOW_ADDRESS, from within DTS programming and verify models. Previously this information was available only within the FILE_ADDRESS variable.
• Enhances capability using the Compose Netlist tool to build netlists based on BSDL files and the Auto JTAG Chain Detect tool.
• Corrects DTS DISABLE section for GenRad ICT chain applications.
• Makes adjustments for Chinese language screen presentations.

• Corrects parsing restrictions when translating User Defined Script files with the Compose SVF file tool.
• Ensures that INSTRUCTION CAPTURE tests are not implemented for any instruction loading scans if “tap instruction capture” is not selected on the TestGen page

• Modifies and improves test generation related to assigned logic elements.
• Includes Net Order list, used to show sequence of net names in ProScan, in Copy Settings operation.

• Corrects problem presenting all diagnostic messages for TAP test failures.
• Adjusts synchronization with onTAP Network License Manager server .

• Speeds up reloading test projects on the Development screen.
• Improves management of changes to the jumpers list.
• Upgrades auto detection of JTAG chains. Results are placed in a file as well as shown on the Test screen

•  Adds capability to place related differential pair nets together in test report and on ProScan screen.
• Upgrades ability to add alternate IDCODES. See Test menu.

• Adds capability to diagnose only opens faults and filter out other faults for a/c coupled differential pins. See Diagnose Only Opens on Development screen’s Settings page.
• Upgrades .test file, accessed using View Test Report button on Test screen. Test values are truncated at the point where a test file stops in the events that the fault count exceeds MAX FAILS.  ProScan screens have been upgraded in a similar manner.

• Adds search control on Non-Scan page to search for model names.
  
• Adds capability to test only differential circuits while disabling other test activity.
  
• Upgrades diagnostic resolution for circuits having intermittent test results.
• Corrects potential program exception problem when jumpers are added.

• Corrects problem displaying DTS lines in ShowMe! debug tool.
• Corrects crash condition that could occur when maximizing and minimizing screens in a particular sequence.
• Provides additional updates for TestGen page settings and procedures.
• Corrects problem showing negative numbers in reports files for nets not having scan pins.

• Corrects problem restoring HIGHZ test procedure name when reloading a test on the TestGen page.
• Corrects problem running large test suites on the MFG Test screen.

• Updates onTAP so that IEEE 1149.6 A/C tests work with multiple JTAG chains and onTAP USB cables.
• Corrects problem restoring Clamp instruction when reloading a test on Development screen.
• Upgrades user test messages on Test screen.
• Corrects test generation handling cells where the control cell is the same as the drive cell.
• Corrects problem in cluster tests when using OL and OH instructions  on external pins that are not in a pin group.

• Adjusts TCK rate adjustments in the Test and Programming Cable dialogue.
• Adjusts for IEEE 1149.6 operations when testing across multiple JTAG chains

• Improves test generation and management of bus signals when bidirectional pins share a common tri-state control cell.
• Adds capability to set more guards using the Guards+Attributes tab within ProScan.
• Shows all pins on Jumpers page. Previously, only devices having more than four pins were shown in the FromPin and ToPin lists.

Build 4251

• Adds additional Debug menu items including the ability to learn measured test results and to disable tests at individual test vectors during debug
• Upgrades capability in ProScan to examine ATG results for individual pins and to produce individual test scans to check the ATG results. This is intended to help debug test activity in complex non-scan circuits.

Build 4250

Build 4249

• Ensures that all pins are properly updated in cluster test applications having multiple chains where pin instructions related to more than one chain are used in the same scan.
• Corrects Manufacturing  screen layout problem with Cable Test group control box.
• Upgrades GUARD STRING editor allowing guards to be set on a per vector basis as well as on a per pin basis.

Build 4248

• Upgrades test reports, fault coverage reporting format, and tool to summarize fault coverage reports. See onTAP Reports menu.
• Adds tool to automatically create a loopback list for connectors, helpful when logic devices separate connector pins from access to scan pins. See “loopback” in on line Help.
• Adds DTS Library models and makes them accessible from Cluster page.
• Adds flash programming models for S29AL032 as well as several logic models.
• Improves fault coverage in environments with many logic devices, buffers, and transceivers between scan pins.
• Corrects potential problem related to  EXTERNAL pin declarations in DTS models.
• Corrects problem reliably showing scan pin assignments and target device pin matchups on Cluster page.
• Corrects problem with memory leak affecting some applications.
• Updates DLLs.

Build 4247

• Introduces a new capability to reduce flash programming times by recording programming overhead and flash data in a binary record file. See “PlayRecordBinary” in the DTS Test Program Format document within onTAP Help.
• Reduces test execution time within the ProScan environment.
• Adds capabillity on the TestGen Development page to more clearly change cluster test modes of JTAG devices to Extest, Bypass, or Highz.
• Eliminates requirement to use the DisablePreprocessBuffers instruction when using PlayRecordOn/Off instructions in flash programming models.

Build 4246

Build 4245

Build 4244

• Adds debug capability to ProScan screen. See discussion related to debugging and setting guards in the help for the ProScan screen.
• Generalizes translation capabilities for CadSoft Eagle style netlists.

Build 4243

Build 4242

Build 4241

Build 4240

• Ensures that a clock is developed for memory cluster tests where the clock pins are differential pairs declared in the BSDL file.
• Corrects problem with settings for dual channel high speed onTAP USB cable so that full range of TCK rates is available.

Build 4239

• Adds capability to include test setup messages, shown when loading or selecting an SVF file, with each SVF. To use, select an SVF file from list on Test screen and click the Test Setups / User Messages button.
• Loads SVF file when accessing Test screen following test generation on the Development screen.

Changes centered around settings on TestGen page plus various program corrections and upgrades.

• Corrects possible crash condition when looping tests or running burn-in
  
• Allows jumpers to be added for no-connect pins
  
• Upgrades syntax check on Guards page
  
• Adds syntax check to ensure that declared subroutines have a body
  
• Corrects potential crash when selecting Save Project from the File menu
  
• Corrects problem using hex notation X’ when passing constant values as arguments to subroutines

• Upgrades handling of Jumpers so that jumper settings are implemented directly in a netlist when an application netlist is read by onTAP
  
• Corrects test generation problem involving logic element circuits
  
• Improves management of onTAP USB cable in test start-up situations, when a UUT’s power is cycled, and when a USB cable is disconnected / reconnected
  
• Upgrades Development screen’s TestGen page so that test procedures may be refined by selecting specific TAP instructions or procedures. Test generation will proceed normally without changing any of the check box selections on the TestGen page.
  
• Reduces clutter on the Settings page. Moves Adaptor file settings to the Cables menu pages from the Settings page. An onTAP USB cable-based adaptor file is created by default if an adaptor file doesn’t exist
  
• Adds project notes access on the Projects page, enabling users to maintain notes about aspects of a project
  
• Upgrades handling of GetKeyboardStr instruction to support the Cancel button so that Cancel results in a null string length

• Drops need to have Microsoft .NET Framework installed when running onTAP. This was requirement had begun with build 4229.
• Corrects problem that required program reloads when cycling power on boards having more than one JTAG chain.

• Introduces ShowMe!, a new tool for debugging cluster tests. ShowMe! Is accessible from the Debug menu and provides a spreadsheet-like view of drive and capture values at all pin groups, pins, and DTS program variables throughout a test. ShowMe! can be run with or without a test/program cable attached.
• Allows the debug mode ‘Log TDO HEX Data’ to run and capture data with or without a test/program cable present.
  
• Makes default status of JTAG devices ‘unsafe’ in Test Only Safe Circuit mode, unless the JTAG device’s reference designator is placed in the …project_settings\safe_devices_<test_name>.txt list
  
• Simplifies and improves controls on USB Cables dialog used to create adaptor files for USB cables.
  
• Updates Browse control on Projects page
• Adds text to scandata debug file showing failing pin names

• Add netlist translator support for Zuken CFF files
• Adds safeguard when testing nets having JTAG pins and the associated JTAGdevice is in Bypass mode.  These nets will not be tested by other JTAG pins on the nets unless the JTAG device in Bypass is listed in the safe_circuits_<test_name>.txt file

• Updates settings and presentation of scan pin assignments on the Cluster page
• Adds new tests to quickly check the onTAP USB cable from the test screens and USB Cable settings page

• Adds a Settings change log with an undo capability on the ProScan screen when using the Guards+Attibutes page. This provides a convenient way to make guards and attribute changes, compile, test, review results, and undo changes as required
• Adds additional diagnostic information related to TAP test failures. Detailed bit information for instruction capture and IDCODE code responses is provided in diagnostic messages

Adjusts ProScan so that screen is updated only once after a recompile.

Includes Microsoft Visual Studio redistributable DLLs in installation package so that onTAP should run without the MS redistributable. However, if there are DLL complaints when loading onTAP, please run the MS redistributable at this link
http://www.microsoft.com/download/en/details.aspx?familyid=A7B7A05E-6DE6-4D3A-A423-37BF0912DB84&displaylang=en

• Upgrades “Update Other Adaptors’ tool  on USB Cables dialogue, allowing all adaptor files to be updated with USB port and TCK rate assignments.
  
• Adds ‘drag-and-drop’ capability to reorder SVF files in SVF Files list on Manufacturing Test screen.

• Upgrades GenRad ICT translator
  
• Adds Direct Drive, allowing programming of serial flash directly from USB cable leads, bypassing boundary scan
  
• Upgrades handling of alternate IDCODES at run-time
  
• Updates onTAP DLLs

• Adds capability to accept alternate IDCODES for JTAG devices at run-time. Press F1 for Help on Test screen for details
  
• Corrects problem where integer array expressions can be excluded in SVF files

• Corrects diagnostic messages for %PIN: expressions for DTS models that use pin groups where individual pins are declared as EXTERNAL
• Corrects screen text for Windows UI fonts and resolutions where text on the screen can be cropped

• Adds capability to directly run binary flash files. ( Check with technical support to see which flash devices have been tested.)
• Reduces test execution times
  
• Adds preventive code for potential program exceptions
  
• Upgrades Netlist Merge tool providing capability for accepting user-edited merge_pins files. Adds debug trace file that shows sequence of merge steps
  
• Adjusts screen settings for PCs in China

• Adds capability to write message strings with variables from within the ShowFail(message) instruction
  
• Adds capability to run script-generated SVF files with updated scans based on varying bit string values

• Corrects problem setting preload values for 1149.6 AC differential receivers when the pin type is bidirectional
  
• Corrects problem setting guards from ProScan on bidirectional differential receiver pins.
• Corrects problem related to option on Jumpers page to automatically add jumpers for IEEE 1149.6 testing of capacitively coupled devices. Extends capability so that in-line resistors are accounted for

• Updates support for onTAP GPIO Serializer
  
• Corrects test generation problem when pins from devices in multiple JTAG chains are used in cluster tests
  
• Upgrades handling of unplug-plug events for onTAP USB cables

• Adds support for AUG netlist format.
  
• Corrects problem showing bit-string message values in user-defined scripts.

• Improves Reset operation of USB cable when Reset buttons are clicked and when calling Reset from the onTAP DLLs.
• Adjusts diagnostic message for no-connect pins in the event of stuck-at faults.
• Upgrades use of  EXTEST_TRAIN instruction for 1149.6 AC testing.

• Adds pin-wiggle capability in ProScan for 1149.6 AC coupled pins.
  
• Upgrades Guards+Attributes tab in ProScan to facilitate setting guards, attributes, recompiling, and rerunning tests from within ProScan.
  
• Corrects problem showing test messages for multi-chain applications.
  
• Adjusts FabMaster netlist translator code.

• Updates for Play/Record feature used when loading configuration files.
  
• Updates for licensing and onTAP Network License Manager.

• Includes updates for programming Lattice FPGAs.
  
• Upgrades differential pair testing. Reads port groupings of differential pair pins in BSDL files and accounts for all positive and negative side pins using BSDL files and netlist.

• Adds Play/Record feature for SVF program configuration files. Play/Record converts SVF files to binary, allowing faster programming. Play / Record can be enabled from the Cables menu for specific SVF files.
  
• Ensures that guard constraints in the Browse Circuit view are updated when a guard condition is changed the Vector view

Corrects potential false failures in multi-chain applications

• Corrects problem writing failure reports from Mfg test screen when Operator, Serial Number, and Unit Type text strings are entered.
• Adds pin-wiggling capability on Nets screen and ProScan for the Xilinx USB cable

• Corrects test generation for circuits with shared control cells to ensure that only one driver on a net is active at one time.
  
• Moves license file, LogicPinMaps and other files within the onTAP folder to the c:\Flynn Systems Corp\onTAP folder, in order to avoid write protected folders within the c:\Program Files folder. The default installation folder is still c:\Program Files\onTAP.
• Adds code in preparation of support for the Xilinx USB Cable II.

• Corrects problem with current-limiting option.
  
• Corrects problem writing serial-number-specific files when testing from the Manufacturing Test screen.

• Adds netlist translator support for IPL Wirelist netlists
• Includes adjustment for the current limiting option

• Adjusts ground bounce switch factor operation for pull-up/down tests.
• Introduces option to add vectors and extend fault coverage in applications where pins share common tri-state control cells. The option is controlled by the “Alternate drive on pins having common control cells” check box on the settings page and the default setting is enabled.
• Ensures that all eligible pins alternate drive on nets having multiple scan pins.
• Corrects problem showing all LogicPinMap models on the non-Scan page.

• Improves operation of JTAG Chain Auto Detect.
• Adds support for ground debounce switch factor for pull-up/down tests.
  
• Adds protection for test settings in the ProScan environment.

• Adds support for return instruction in DTS model subroutines.
  
• Updates and expands on-line help.

• Adds support for use of local variables within subroutines.
  
• Adds corrections for test status messages when stopping a test.
  

• Includes inductors in tests solutions and treats inductors as low impedance resistors.
  
• Corrects problem with test generation involving low impedance devices.