onTAP Boundary Scan Software Current Build Notes.

Corrects potential crash related to ATG involving bus transceiver applications.

Adds protection for user-defined tests so that they are run as standard onTAP files.

Corrects problem related to running multiple chain applications with onTAP USB cables.
Corrects problems introduced in build 4024 related to running to some cluster tests.

Adds safeguard against license problems.

Adds debug tools on the Netlist Browser screen in the Command List for Test Development and Debug section. These include an instruction to show uncontrollable bidirectional pins and also to run the Guards Finder tool.

Corrects problem in Merge Netlist tool related to pin-to-pin merging.

Corrects problem in Merge Netlists tool when merging more than two netlists.

Corrects parsing problems related to '%' characters in the Merge Netlist tool and also mixes of space and tab characters in some netlist translators.

Improves handling of SVF configuration files for programmable devices when using the onTAP USB cable. Boosts speed and improves user messages.

Corrects problem in Merge Netlist tool related to specifying pin-to-pin vs connector-to-connector merge.

Adds SetontapUSB instruction to DTS models. The SetontapUSB instruction can be used to change the TCK rate from within a DTS model.

Updates ontap.dll.

Adds facilities for troubleshooting and technical support at Flynn Systems.

Corrects a problem involving the DTS MESSAGE_FILE instruction.

Adds debug aid. An exit instruction can be inserted into an SVF file without loss of diagnostic messages.

Adds list of net pins for opens faults.

Adds protection on TestGen page to avoid changing a user-selected test procedure when working with cluster tests.

Ensures that all addresses in a flash INTEL_HEX_FORMAT data file are programmed, avoiding problem where the program could quit before the last address was programmed.

Corrects problem related to properly asserting the bit closest to TDI when bit stream consisted of an integral number of bytes.

Corrects and improves code related to cluster test device to BS device pin assignments.

Improves Query JTAG Chain tool on the Test screen. Query JTAG Chain detects JTAG chains based on available BSDL files.

Adjusts screens for Japanese formatting.

Shows non-installed messages for devices on the BSDL Matches page.

Add netlist translator for PADS PXR files.

Adjusts handling of unsigned 64 bit integers in cluster test programs involving pin groups.

Corrects a problem where a percent character is dropped in a double percent group within a DTS file when onTAP copies the file from a project folder into the DTS Models subdirectory.

Corrects problem presenting a final message after completing an ISP configuration in some circumstances.

Adjusts handling and increases fault coverage of nets and output cells with common tri-state control cells.

Adds a CAPACITIVE_COUPLING guard and a capability to test across series capacitors.

On the non-JTAG page, requires explicit matches of onTAP's pin-map and logic models to application circuit locations. Even if an application's device type matches an onTAP model name, an explicit match by the user must still be made. This allows devices with names that are the same as onTAP model names to be considered unsafe until the user matches the devices.

Adds reports subdirectory when using the Compose Netlist tool.

Adjusts Merge Netlist tool to equate ball or pin names where one has leading zeroes and another does not.

Improves the Compose Netlist tool to accommodate flash programming.
Adds capability to compose netlists based on BSDL files, DTS models, and logic models.
Adds a tool to join pins into one net, for example a BS pin and a flash device pin.

Corrects and upgrades ATG handling for bidirectional quickswitches.

Cluster Test Model Handling - Upgrades ATG related to handling cluster test models.

No-Test Option - Adds a No-Test option for net names on the non-JTAG page. Nets designated as no_connect should be marked as No-Test so that onTAP does not become bogged down during test generation.
Soft Disconnect/Reconnect - Adds capability to automatically generate a soft disconnect/reconnect command if onTAP senses that it has lost a handle to a USB cable. This helps recover the cable operation without the necessity of operator intervention. Cleans up some inconsistencies on the TestGen page.

Multiple Breakpoints in Test Program View - Adds capability to insert multiple breakpoints and to clear breakpoints in the Test Program View window of the Waveform display.

IDCODE Editor - Adds Quit button on the TestGen page to exit TestGen Prep ATG runs. - Failure to identify power, ground, and Vref nets can lead to excessive ATG run times, hence the desirability of a Quit button.

IDCODE Editor - Adjusts IDCODE editor.

IDCODE editor fix - Corrects problem with IDCODE editor
Examine _SVF tool problem fix - Corrects problem with examine_svf tool when control cells in an application are cell number 0 in a boundary register.
Legacy Syntax in DTS models Restored - Restores legacy syntax in DTS models involving EXTERNAL pin assignments, such as .EXTERNAL(U166.C1,U166.D1…)

One-Step Netlist Merge Upgrade - Upgrades capability to merge multiple netlists in one step.

Single-Pin Merge Points in Netlist Merge - Adds capability to include single-pin merge points as well as corresponding connectors in netlist merges with two or more netlists.

One-Step Netlist Merge - Adds capability to merge multiple netlists in one step.

Netlist Merge Tool Upgrade - Upgrades and corrects errors in Netlist Merge tool.
TestGen Resistor Problem Correction - Corrects TestGen problem involving resistors designated as both low-ohm and non-populated.

Corrects Handling of non-JTAG Pin Assignments - Corrects problem related to incorrect test values on non-JTAG buffer control pins.

Iteger Array Capability - Adds integer array capability to DTS cluster model scripts.
Improved Buffer, Xcvr Control Pin Management - Improves management of buffer and transceiver control pins in DTS cluster test models.

Improved Handling of Pin Assignments - Improves handling of boundary scan pin assignments through non-JTAG logic to cluster device pin.

Upgrade Handling of Loopbacks - Upgrades and fixes handling of loopbacks through tri-state buffers. Improves testing and fault coverage for all bus buffers and transceivers.

System Call Instruction - Adds a SystemCall instruction in the DTS modeling language.
Guards Wizard Upgrade - Restores and upgrades the Guards Wizard for automatically removing guards during test development debug.

Transparent Resistor Networks - Corrects potential problem making resistor networks transparent in cluster test applications.

TestGen Problem Fix - Corrects a TestGen problem when a boundary scan device in BYPASS is also a cluster test device.
Eagle Translator Updated - Adds additional capability to Eagle translator to extract resistors’ impedance values.
Improved Licensure function - Improves capability to detect primary MAC address for licensing.

Online Help - Improves online Help.
Corrects Crash Condition - Corrects potential crash condition when opening new projects.

SENSE-HIGH, SENSE-LOW - Ensures that boundary scan pins are not driven when SENSE_LOW or SENSE_HIGH guards are active on a net.

Reads Low Ohm Resistors - Adds capability to read low ohm resistors from Allegro netlists. onTAP will not drive nets having low ohm resistors connected to GND or power.
Resistor Extraction from BOM - Adds capability to extract low and high impedance resistors from BOM spreadsheets.

Test correction - Corrects test on first vector when net has a static guard.
Bus Test Handling - Corrects handling of bus tests when a mix of pins populate the bus, some having drive cells equal to their drive control cells and some which have independent drive and control cells.

FAIL flag correction - Corrects and improves operation of FAIL flag in cluster tests.
Updated DLL - onTAP DLL updated.

Major Enhancements to onTAP are available in Build 3963. Highlights are below; please view the full list of changes here.

Development Screen: Special ATG algorithms for management of non-JTAG circuits...
Facilitates safe-circuit test strategy...
Waveform Display: Adds menu items to Waveform Display. Guards can be set, drivers...
Netlist Browser: Adds menu item to run ATG for individual pins...
Tools Menu: Adds a dialogue tool, Sumarize and View Test Reports to merge results...

Netlist Merge Utility Fix - Corrects problem in Netlist Merge utility.

Improved Diagnostic Messages - Improves diagnostic messages by removing redundant failure statements.
Better Pullup/Pulldown Resitor Tests - Improves pullup and pulldown resistor tests. Removes setup drive on nets that do not have pull resistors.

String Guard Option - Adds string guard option for selected devices on Guards page, allowing drive/sense constraints to be set at selected vectors.

Chain Finder/Editor Fix - Corrects crash in Chain Finder/Editor tool.

Improved Bus Xcvr Management - Corrects and improves management of bus transceivers during ATG.

Diagnostic Message for boundary register length test - Corrects and restores diagnostic message for boundary register length test.

Setting and online Help updated - Includes corrections and improvements to Settings and to online Help text.

Audible Alert - Added selectable beeper alert when TestGen completes compiling a test. See Settings page.
Improved online Help - Improves and brings up-to-date sections of online Help.

Diagnostic Messages for ISP SVF - Improves diagnostic messages for ISP SVF programming files.

Modified Layout - Adds additional information regarding test strategies to on-line help in the Procedures and Examples section.
Buffer Scan for multi-chain applications - For muti-chain applications, adds a buffer scan after transitioning from the SAMPLE instruction to EXTEST.

Modified Screen Layout - Adjusts screen layout dimensions of the Development screen to provide more room on the right.

Modified Layout - Adjusts layout to improve fit with 1024x768 screen resolution.
FabMaster Translator revised- Adjust translator for FabMaster netlist files to recognize the expression “Test Expert” in the header section.

Report Writer Crash Condition - Corrects possible crash condition in report writer.
Correction to Test Screen Message - Corrects parsing error in netlist translator for IPL.DAT net files.
Netlist Translation Support- Adds translation support for netlists distributed over multiple .net files.

Reactivate Guards - Reactivates guards to sense external values, disabled be error in the previous build.
Collectively Change USB Cables - Adds capability to collectively change USB cables to TAP assignments for all tests in a project with one mouse click.

Binary to Intel HEX Translator Fix - Corrects problem with checksum code in Binary to INTEL HEX translator tool.
File Name Adjustment - Adjusts file names in Save Test Reports feature on Manufacturing Test screen to include the test name as well as unit type and serial number.

Multi-Chain Application Correction - Corrects problem in multi-chain applications at first vector when sensing on pins that have guards to actively drive net..
Correction to Test Screen Message - Corrects Test screen message for cluster tests in multi-chain applications where all TAP tests have been omitted.
Save Test Results by Serial Numbers - Adds capability to save test reports based on serial number and unit type. This is enabled on the Manufacturing Test screen and reports are saved in a project’s Test Reports sub-directory. See Test Options and Help on that screen

Maximize controls for Development, Test windows - Enables
maximize controls for the Development and Test windows.
Correction to Handle RUNTEST -- Adds correction to handle RUNTEST instruction that include TCK counts and minimum time requirements for SVF programming files.
Correction to Handling End States - Adds correction to handling end states Pause-IR and Pause-DR when using USB cable and loading programming files.

Period Character Filterx - Filters period characters from test names on the Projects page.

Assignment of test string variables - Adds capability to assign and test string variables in cluster tests as well as to extract string values from files using a new instruction, GetFileString.
Guard to drive pin values maintained - Ensures that guards to drive pin values are maintained during resistor pull tests when outputs are otherwise tristated.

Tests for guards maintained -Ensures that tests for SENSE_INPUT_LOW and SENSE_INPUT_HIGH guards are maintained for all vectors.
Tests on nets w/o pull resistors - Eliminates tests on nets that do not have pull resistors during pullup and pulldown tests, eliminating false failures and improving diagnostic precision.

Better non-ASCII Character Filtering - Improves filter for non-ASCII characters in BSDL files.
Save/Restore Settings Improvements - Adds additional corrections for saving and restoring settings

Guards String Added - Added guards string as an additional guards option. Guard strings may be used to override ATG and assign any drive or capture value at any pin for any vector.
Save/Restore Settings Problem fixed - Corrects problems saving and restoring settings introduced in build 3924.

Potential Crash addressed - Corrects crash possibility in Waveform display.

Pull Down Resistor Fix - Corrects problem related to pull down resistor tests.

Reset on Test Screen for USB cable - Adds a Reset capability on the Test screen for the onTAP USB cable.
Net Browser read back fixed - Corrects a Net Browser read back problem when using the USB cable.

Multiple JTAG Chain Controls Improved - Improves management of applications having multiple JTAG chains when using USB cables
DLL Updated - Updates on DLL

Chain and Guard Value Controls Improved - Improves capability to individually control chains and guard values in a multi-chain application.
Added Warning Messages for Saving Settings - Adds warning messages and safe-guards when saving and restoring settings for specific tests within a project.

Fix for Crash When Tests Deleted - Fixes crash that could occur when tests were deleted and the test sequence reordered.
Enhanced Diagnostic Messages - Enhances diagnostic messages.

Improved Diagnostic Messages - Improves handling of diagnostic messages in applications that use onTAP USB cables and have multiple JTAG chains.
Asdditional Support for FabMaster Netlists - Adds support for a version of FabMaster netlists having a parts file named material.asc.

Test Selection Controls Improved Adjusts test selection controls on Test and Manufacturing screen Test Sequencer lists so that they conform to Windows standards.
Better Save/Restore Tasks - Improves save and restore tasks on the Development screen.

Better ability to set guard values from Net Browser - Refines capability to set guards from the Net Browser.
Change TCK with USB cable - Adds capability to change TCK rate with the onTAP USB cable when switching between tests.

Adds method to set guard values from Net Browser - Adds capability to the Net Browser screen to assist setting guard values during test development. The procedure is described in on-line help.
Corrects Custer Test operation - Corrects a problem, introduced in build 3908, related to cluster test operation.

Adds Instruction to to retrieve keyboard strings - Adds instructions that retrieve keyboard strings from users in DTS cluster test models.
Cadenc PST Netlist Translator - .Adds translator support for Cadence PST netlists.

Adds Instruction to shorten scans - Adds TruncateUnusedTdi() instruction to shorten scans and reduce flash programming times.
Development Screen Enlarged - Widens
Development screen to accommodate some Windows XP screen
configurations.

Better handling of Boolean expressions - Strengthens handling of more complex Boolean expressions in DTS cluster test models.
FABMASTER translation Corrected - Corrects translation of FABMASTER netlist files.

Omit state reset selectivity added - Adds capability to selectively omit state resets and TAP integrity tests in SVF files. This is helpful for cluster tests and user defined scans where pin context needs to be held between tests.

Guard Invert Capture Value fix- Fixes bug and corrects handling of guard “invert capture value”.
Guards Wizard Corrected - Corrects problem running Guards Wizard that was introduced with the Query JTAG Chain on the Test Screen.
DLL Recompiled - Recompiles and updates onTAP DLL.

Identity Page/Jumpers Page - Fixes possible crash when making adjustments between the Identify page and the Jumpers page.

Control Argument Added to OpenProgeramming File - Adds a new control argument, ADDRESS_INCREMENT, to the OpenProgrammingFile function for flash programming.  ADDRESS_INCREMENT can be used to control address pin group incrementing, independently of data width.

Now converts binary to Intel hex - Adds translator to convert binary files for flash images to INTEL HEX format. See Translators menu.

Zuken Vistula Trams;ator- Adds translator for Zuken Visula netlists.

Improved Test, Manufacturing Screens - Adjusts and improves messages on Test and Manufacturing screens.

Improved messages and scan sequencer operation - Improves messages and scan sequencer operation on the Test and Manufacturing screens. Facilitates selection and de-selection of tests.

Output Group (OG) Instructions - Ensures
correct operation of Output Group (OG) instructions
so that pin group values following a test capture are
assigned the test capture value reported on the pin
group’s pins.
Waveform Display of Failing Pin Groups - Corrects Waveform display of failing pin groups.

Faster Flash Programming - Adds significant speed boost for flash programming with USB Cable. See ThreadScansOn() instruction in Help.
New Test Screen Manu - Adds new menu facility to reorder tests on Test screen and to run individual tests.
Reference Voltage Nets Declaration - Ensures that nets declared as reference voltages do not have pull-up or pull-down resistor tests.
Scan Sequencer - Enlarges Scan Sequencer window on Test screen and reorganizes some test controls.

Opens Faults Reporting Diagnostic Messages - Corrects reporting of opens faults in diagnostic messages.
Project Settings Handling - Improves handling of project settings for save and restore.
USB Cable Operation - Improves USB cable operations.

Better Handling of Binary Number Notation - Upgrades
handling of binary number notation in DTS models.
Improved Handling of JTAG Chain Definitions - Improves
handling of JTAG chain definitions when importing older
onTAP tests to current builds.

Handling of %%FL Operator Corrected - Corrects handling of %%FL operator in DTS models.
BSDL Translation Adjusted - Includes BSDL translation adjustment.