Accepting New Turnkey JTAG Projects

admin — Tue, 17 Nov 2009 20:58:35 +0000

Flynn Systems wants to let our users know that we are accepting new JTAG / Boundary Scan projects for Q1-2/10

While our standard Technical Support provides assistance with test and development issues, our boundary scan test development services go beyond onTAP technical support services by taking the boundary scan / JTAG test development and debugging off your plate, allowing you to focus your undivided attention on your core business issues as you move through development and prototyping into manufacturing.

Our Boundary Scan Test Development Service is very popular with both existing and new customers. In fact, 4 out of 5 customers who have used onTAP boundary scan test development services once, immediately recognize the cost and time savings, and return within 4 months with another project. By turning over your JTAG / Boundary Scan test development to Flynn Systems, you are able focus on other aspects of your project without being distracted by developing and debugging boundary scan tests.

We ensure that your boundary scan tests are maximized for the highest possible fault coverage, are completely debugged, and are ready for the manufacturing floor, so the end user only has to “press a button.”

We support our tests and we will support you and/or your contract manufacturer by answering questions and bringing all parties involved up-to-speed with boundary scan test and onTAP procedures and reports.

Our test development features:

JTAG TAP infrastructure tests.
Interconnect tests including detection of opens, shorts, stuck-at, bus-wire, pull-up/down related faults.
Memory tests
Cluster tests of non-JTAG components
Flash programming
In-system programming configuration
Pin-level diagnostics
On-going support

All of our tests are comprehensive, accurate, supported and reliable.

Call us today to get started.

Click here to learn more about onTAP Turnkey Service

Flynn Systems » pre-developed tests

Accepting New Turnkey JTAG Projects